2
2
NEW
Improved Test Reliability
If a test lead wire were
to break during testing with
a tester that does not offer
contact check functionality,
defective test pieces would be
judged to be non-defective.
Withstanding voltage tester
Voltage
output
Voltage monitor
●
Contact check function improves test reliability
The 3174’s contact check function lets you
detect test lead
wire breaks and faulty
contact during testing by sensing
measurement issues in real time.
Withstanding voltage tester
Voltage output
Voltage monitor
The 3174 improves test
reliability by monitoring
voltage to detect lose
leads during testing
and faulty wiring during
measurement.
*Since contact check is performed
while testing is in progress, use of
contact check functionality does
not increase cycle time.
Faulty contact
*Break
in lead
Voltmeter
Contact check
Test current
Voltmeter
Contact check
Test current
Test piece
If a test lead were to come lose
during testing with a measurement
device that does not offer contact check
functionality, defective test pieces
would be judged to be non-defective.
Faulty contact
*Disconnected
lead
Test piece
Fluorescent display tube
The display uses a bright,
easy-to-read fluorescent tube.
DANGER lamp
Flashes a warning during testing and
whenever high voltage is present at the
terminals.
The DANGER lamp turns off when
the voltage at the output terminals is
no greater than AC 30 V or DC 60 V.
9613
SINGLE-HAND
REMOTE CONTROL
(option)
9614
TWO-HAND
REMOTE CONTROL
(option)
External switch
NEW
Enables start/stop control by means of
the 9613 SINGLE-HAND REMOTE
CONTROL or 9614 TWO-HAND
REMOTE CONTROL.
(The 9613 and 9614 are optional.)
Test mode selection
Select from three test modes:
1.Manual test mode: W (withstand voltage testing) / I (insulation resistance testing)
2.Automatic test mode: W→I / I→W
●
Judgment output at forced stop
The ability to obtain a judgment even after a forced stop increases testing freedom.
●
Ramp timer function
The ramp-up initial value, ramp-up and ramp-down time
parameters can be set independently.
●
True effective value display
NEW
●
Continued analytical testing after FAIL judgments
Test pieces can now be analyzed by means of detailed monitoring of the
test current accompanying FAIL judgments.
●
Eliminate the effects of supply voltage fluctuations
●
Delay timer function