BS62LV1027
DC ELECTRICAL CHARACTERISTICS (T
A
= -40
O
C to +85
O
C)
PARAMETER
NAME
V
CC
V
IL
V
IH
I
IL
I
LO
V
OL
V
OH
I
CC
(5)
I
CC1
I
CCSB
I
CCSB1
(6)
PARAMETER
Power Supply
Input Low Voltage
Input High Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Operating Power Supply
Current
Operating Power Supply
Current
Standby Current – TTL
Standby Current – CMOS
V
CC
= Max, V
IN
= 0V to V
CC
V
CC
= Max, CE1= V
IH
, CE2= V
IL
, or
OE = V
IH
, V
I/O
= 0V to V
CC
V
CC
= Max, I
OL
= 2.0mA
V
CC
= Min, I
OH
= -1.0mA
CE1 = V
IL
, CE2 = V
IH
,
I
DQ
= 0mA, f = f
Max
(4)
TEST CONDITIONS
MIN.
2.4
-0.5
(2)
TYP.
(1)
--
--
--
--
--
--
--
--
--
MAX.
5.5
0.8
V
CC
+0.3
1
1
0.4
--
18
47
2
10
(3)
UNITS
V
V
V
uA
uA
V
V
mA
mA
mA
uA
2.2
--
--
--
2.4
--
--
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
V
CC
=3.0V
V
CC
=5.0V
CE1 = V
IL
, CE2 = V
IH
,
I
DQ
= 0mA, f = 1MHz
CE1 = V
IH
, or CE2 = V
IL
,
I
DQ
= 0mA
CE1≧V
CC
-0.2V or CE2≦0.2V,
--
--
--
--
--
--
0.02
0.4
0.5
1.0
1.5
5.0
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
O
1. Typical characteristics are at T
A
=25 C and not 100% tested.
2. Undershoot: -1.0V in case of pulse width less than 20 ns.
3. Overshoot: V
CC
+1.0V in case of pulse width less than 20 ns.
4. f
Max.
=1/t
RC.
O
5. I
CC (MAX.)
is 17mA/46mA at V
CC
=3.0V/5.0V and T
A
=70 C.
O
6. I
CCSB1(MAX.)
is 1uA/3uA at V
CC
=3.0V/5.0V and T
A
=70 C.
DATA RETENTION CHARACTERISTICS (T
A
= -40
O
C to +85
O
C)
SYMBOL
V
DR
I
CCDR
(3)
t
CDR
t
R
PARAMETER
V
CC
for Data Retention
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery Time
O
TEST CONDITIONS
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
CE1≧V
CC
-0.2V or CE2≦0.2V,
V
IN
≧V
CC
-0.2V or V
IN
≦0.2V
MIN.
1.5
--
0
TYP.
(1)
--
0.02
--
MAX.
--
0.5
--
--
UNITS
V
uA
ns
ns
See Retention Waveform
t
RC
(2)
--
1. V
CC
=1.5V, T
A
=25 C and not 100% tested.
2. t
RC
= Read Cycle Time.
O
3. I
CCRD(Max.)
is0.3uA at T
A
=70 C.
LOW V
CC
DATA RETENTION WAVEFORM (1) (CE1 Controlled)
Data Retention Mode
V
CC
V
CC
V
DR
≧1.5V
V
CC
t
CDR
V
IH
CE1≧V
CC
- 0.2V
t
R
V
IH
CE1
R0201-BS62LV1027
3
Revision
2.4
Oct.
2008
BSI [ BRILLIANCE SEMICONDUCTOR ]
