DATA SHEET
6/12
6. Reliability
(1) Details of the tests
Test Item
Continuous Operation Test
Test Condition
Ta=25 C, I
F
=350 mA× 1000 hours
Low Temperature Storage Test
Ta=-40 C × 1000 hours
High Temperature Storage Test
Ta=100 C × 1000 hours
Moisture-proof Test
Thermal Shock Test
Solder Heat Resistance Test
Ta=60 C, 90 %RH for 1000 hours
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
Recommended temperature profile (reflow soldering) × 2,
(2nd test must be started after the samples are stabilized thermally.)
(2) Judgment Criteria of Failure for Reliability Test
Measuring Item
Forward Voltage
Total Luminous Flux
(Ta=25 C)
Judgment Criteria for Failure
Symbol
Measuring Condition
V
F
Φv
I
F
=350mA
I
F
=350mA
> U × 1.2
< S × 0.7
U defines the upper limit of the specified characteristics. S defines the initial value.
Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
Symbol
Name
CITILED
CL-L400-MC1L1-A
CITIZEN ELECTRONICS CO., LTD. JAPAN
Ref.CE-P1158 05/11
CITIZEN [ CITIZEN ELECTRONICS CO., LTD. ]
