CY7C265
Electrical Characteristics
Over the Operating Range
7C265-15, 25
Parameter
V
OH
V
OL
Description
Output HIGH Voltage
Output LOW Voltage
Test Conditions
V
CC
= Min., I
OH
= –2.0 mA
V
CC
= Min., I
OH
= –4.0 mA
V
CC
= Min., I
OL
= 8.0 mA Com’l
V
CC
= Min., I
OL
= 12.0 mA
V
CC
= Min., I
OL
= 6.0 mA Mil
V
CC
= Min., I
OL
= 8.0 mA
V
IH
V
IL
I
IX
I
OZ
I
OS[4]
I
CC
V
PP
I
PP
V
IHP
V
ILP
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Leakage Current
Output Short Circuit Current
V
CC
Operating Supply
Current
Programming Supply Voltage
Programming Supply Current
Input HIGH Programming
Voltage
Input LOW Programming
Voltage
3.0
0.4
GND < V
IN
< V
CC
GND < V
OUT
< V
CC
,
Output Disabled
V
CC
= Max., V
OUT
= GND
V
CC
= Max., I
OUT
= 0 mA Com’l
Mil
12
–10
–40
2.0
0.8
+10
+40
90
120
140
13
50
3.0
0.4
12
13
50
3.0
0.4
12
–10
–40
2.0
0.8
+10
+40
90
100
–10
–40
2.0
0.8
+10
+40
90
80
120
13
50
V
mA
V
V
0.4
0.4
V
V
µA
µA
mA
mA
0.4
0.4
0.4
Min.
2.4
2.4
2.4
V
7C265-40
7C265-50
V
Max. Min. Max. Min. Max. Unit
Capacitance
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25
°
C, f = 1 MHz,
V
CC
= 5.0V
Max.
10
10
Unit
pF
pF
Notes:
3. See the last page of this specification for Group A subgroup testing information.
4. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
5. See Introduction to CMOS PROMs in this Data Book for general information on testing.
Document #: 38-04012 Rev. **
Page 3 of 13
CYPRESS [ CYPRESS SEMICONDUCTOR ]
