3D3622
SILICON DEVICE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature:
25
o
C
±
3
o
C
Supply Voltage (Vcc):
5.0V
±
0.1V
Input Pulse:
High = 3.0V
±
0.1V
Low = 0.0V
±
0.1V
Source Impedance:
50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
PW
IN
= 20ns
Period:
PER
IN
= 2 x Prog’d Pulse Width
OUTPUT:
R
load
:
C
load
:
Threshold:
10KΩ
±
10%
5pf
±
10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
5pf
Digital
Scope
470Ω
NOTE:
The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
REF
PULSE
GENERATOR
OUT
TRIG
TRIG
DEVICE UNDER
TEST (DUT)
OUT
IN
TRIG
DIGITAL SCOPE/
TIME INTERVAL COUNTER
Figure 8: Test Setup
PER
IN
PW
IN
t
RISE
INPUT
SIGNAL
2.4
1.5
0.6
t
FALL
V
IH
2.4
1.5
0.6
V
IL
t
PW
t
ID
OUTPUT
SIGNAL
1.5
V
OH
1.5
V
OL
Figure 9: Timing Diagram
Doc #06008
5/8/2006
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
7
DATADELAY [ DATA DELAY DEVICES, INC. ]
