3D7215
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature:
25
o
C
±
3
o
C
Supply Voltage (Vcc):
5.0V
±
0.1V
Input Pulse:
High = 5.0V
±
0.1V
Low = 0.0V
±
0.1V
Source Impedance:
50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 1.0V and 4.0V )
Pulse Width:
PW
IN
= 1.5 x Total Delay
Period:
PER
IN
= 3.0 x Total Delay
OUTPUT:
R
load
:
C
load
:
Threshold:
10KΩ
±
10%
5pf
±
10%
2.5V (Rising & Falling)
Device
Under
Test
10KΩ
5pf
Digital
Scope
470Ω
NOTE:
The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
GENERATOR
OUT
TRIG
IN
DEVICE UNDER
TEST (DUT)
OUT1
OUT2
OUT3
OUT4
OUT5
REF
IN
TRIG
DIGITAL SCOPE/
TIME INTERVAL COUNTER
Figure 2: Test Setup
PER
IN
PW
IN
t
RISE
INPUT
SIGNAL
4.0
2.5
1.0
t
FALL
V
IH
4.0
2.5
1.0
V
IL
t
PHL
t
PLH
OUTPUT
SIGNAL
2.5
V
OH
2.5
V
OL
Figure 3: Timing Diagram
Doc #01015
11/8/01
DATA DELAY DEVICES, INC.
Tel: 973-773-2299
Fax: 973-773-9672
http://www.datadelay.com
4
DATADELAY [ DATA DELAY DEVICES, INC. ]
