3D7408
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature:
25
o
C
±
3
o
C
Supply Voltage (Vcc):
5.0V
±
0.1V
Input Pulse:
High = 3.0V
±
0.1V
Low = 0.0V
±
0.1V
Source Impedance:
50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
PW
IN
= 1.25 x Total Delay
Period:
PER
IN
= 2.5 x Total Delay
OUTPUT:
R
load
:
C
load
:
Threshold:
10KΩ
±
10%
5pf
±
10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
Digital
Scope
5pf
470Ω
NOTE:
The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
REF
PULSE
GENERATOR
OUT
TRIG
IN
DEVICE UNDER
TEST (DUT)
OUT
IN
TRIG
DIGITAL SCOPE/
TIME INTERVAL COUNTER
Figure 6: Test Setup
PER
IN
PW
IN
t
RISE
INPUT
SIGNAL
2.4V
1.5V
0.6V
t
FALL
V
IH
2.4V
1.5V
0.6V
V
IL
t
PHL
t
PLH
OUTPUT
SIGNAL
V
OH
1.5V
1.5V
V
OL
Figure 7: Timing Diagram
Doc #96003
12/2/96
DATA DELAY DEVICES, INC.
3 Mt. Prospect Ave. Clifton, NJ 07013
7
DATADELAY [ DATA DELAY DEVICES, INC. ]
