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DTM4616 参数 Datasheet PDF下载

DTM4616图片预览
型号: DTM4616
PDF下载: 下载PDF文件 查看货源
内容描述: N和P沟道30 V(D -S)的MOSFET无卤 [N- and P-Channel 30 V (D-S) MOSFET Halogen-free]
分类和应用:
文件页数/大小: 14 页 / 2781 K
品牌: DINTEK [ DinTek Semiconductor Co,.Ltd ]
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SPECIFICATIONS
T
J
= 25 °C, unless otherwise noted
Parameter
Dynamic
a
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulse Diode Forward Current
a
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Reverse Recovery Rise Time
I
S
I
SM
V
SD
t
rr
Q
rr
t
a
t
b
N-Channel
I
F
= 2 A, dI/dt = 100 A/µs, T
J
= 25 °C
P-Channel
I
F
= - 2 A, dI/dt = - 100 A/µs, T
J
= 25 °C
I
S
= 1.6 A
I
S
= - 1.6 A
T
C
= 25 °C
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
0.78
- 0.76
19
26
14
18.5
13
12.5
6
13.5
ns
2.5
- 2.5
20
- 20
1.2
- 1.2
30
50
25
35
V
ns
nC
A
t
d(on)
t
r
t
d(off)
t
f
t
d(on)
t
r
t
d(off)
t
f
N-Ch
N-Channel
V
DD
= 20 V, R
L
= 4
Ω
I
D
5 A, V
GEN
= 10 V, R
g
= 1
Ω
P-Channel
V
DD
= - 20 V, R
L
= 4
Ω
I
D
- 5 A, V
GEN
= - 10 V, R
g
= 1
Ω
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
N-Channel
V
DD
= 20 V, R
L
= 4
Ω
I
D
5 A, V
GEN
= 4.5 V, R
g
= 1
Ω
P-Channel
V
DD
= - 20 V, R
L
= 4
Ω
I
D
- 5 A, V
GEN
= - 4.5 V, R
g
= 1
Ω
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
N-Ch
P-Ch
7
7
10
12
15
30
9
9
16
44
17
33
16
28
10
13
14
16
20
26
30
61
18
19
30
83
30
55
30
61
20
26
ns
Symbol
Test Conditions
Min.
Typ.
a
Max.
Unit
DTM4616
Notes:
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width
300 µs, duty cycle
2 %.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
3