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EDE5104AJSE-6E-E 参数 Datasheet PDF下载

EDE5104AJSE-6E-E图片预览
型号: EDE5104AJSE-6E-E
PDF下载: 下载PDF文件 查看货源
内容描述: 512M位DDR2 SDRAM [512M bits DDR2 SDRAM]
分类和应用: 存储内存集成电路动态存储器双倍数据速率时钟
文件页数/大小: 77 页 / 752 K
品牌: ELPIDA [ ELPIDA MEMORY ]
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EDE5104AJSE, EDE5108AJSE, EDE5116AJSE
×4
Parameter
Symbol
Grade
max.
×8
max.
×16
max.
Unit
Test condition
tCK = tCK (IDD);
Refresh command at every tRFC (IDD)
interval;
CKE is H, /CS is H between valid commands;
Other control and address bus inputs are
SWITCHING;
Data bus inputs are SWITCHING
Self Refresh Mode;
CK and /CK at 0V; CKE
0.2V;
Other control and address bus inputs are
FLOATING; Data bus inputs are FLOATING
all bank interleaving reads, IOUT = 0mA;
BL = 4, CL = CL(IDD),
AL = tRCD (IDD)
−1
×
tCK (IDD);
tCK = tCK (IDD), tRC = tRC (IDD),
tRRD = tRRD(IDD), tRCD = 1
×
tCK (IDD);
CKE is H, /CS is H between valid commands;
Address bus inputs are STABLE during
DESELECTs; Data pattern is same as IDD4W
Auto-refresh current
IDD5
-8E
-6E
105
100
105
100
105
100
mA
Self-refresh current
IDD6*
7
6
6
6
mA
Operating current
(Bank interleaving)
IDD7
-8E
-6E
160
150
160
150
240
230
mA
Notes: 1.
2.
3.
4.
IDD specifications are tested after the device is properly initialized.
Input slew rate is specified by AC Input Test Condition.
IDD parameters are specified with ODT disabled.
Data bus consists of DQ, DM, DQS, /DQS, RDQS and /RDQS. IDD values must be met with all
combinations of EMRS bits 10 and 11.
5. Definitions for IDD
L is defined as VIN
VIL (AC) (max.)
H is defined as VIN
VIH (AC) (min.)
STABLE is defined as inputs stable at an H or L level
FLOATING is defined as inputs at VREF = VDDQ/2
SWITCHING is defined as:
inputs changing between H and L every other clock cycle (once per two clocks) for address and control
signals, and inputs changing between H and L every other data transfer (once per clock) for DQ signals
not including masks or strobes.
6. Refer to AC Timing for IDD Test Conditions.
7. When TC
+85°C, IDD6 must be derated by 80%.
IDD6 will increase by this amount if TC
+85°C and double refresh option is still enabled.
AC Timing for IDD Test Conditions
For purposes of IDD testing, the following parameters are to be utilized.
DDR2-800
Parameter
CL (IDD)
tRCD (IDD)
tRC (IDD)
tRRD (IDD)-
×4/×8
tRRD (IDD)-×16
tCK (IDD)
tRAS (min.)(IDD)
tRAS (max.)(IDD)
tRP (IDD)
tRFC (IDD)
5-5-5
5
12.5
57.5
7.5
10
2.5
45
70000
12.5
105
DDR2-667
5-5-5
5
15
60
7.5
10
3
45
70000
15
105
Unit
tCK
ns
ns
ns
ns
ns
ns
ns
ns
ns
Data Sheet E1043E40 (Ver. 4.0)
9