EM39LV040-55FMC 参数 Datasheet PDF下载

EM39LV040

4M (512Kx8) Bits Flash Memory

SPECIFICATION

DC CHARACTERISTICS (CMOS Compatible)

Parameter

Description

Power Supply Current

I

DD

Read

Program and Erase

I

SB

I

LI

I

LO

V

IL

V

IH

V

IHC

V

OL

V

OH

Standby V

DD

Current

Input Leakage Current

Output Leakage Current

Input Low Voltage

Input High Voltage

Input High Voltage (CMOS)

Output Low Voltage

Output High Voltage

Test Conditions

Address Input =V

IL

/V

IH

, at f=1/T

RC

Min,

V

DD

=V

DD

Max

CE#=OE#=V

IL

, WE#=V

IH

, all I/Os open

CE#=WE#=V

IL

, OE#=V

IH

,

CE#=V

IHC

, V

DD

=V

DD

Max

V

IN

=GND to V

DD,

V

DD

=V

DD

Max

V

OUT

=GND to V

DD,

V

DD

=V

DD

Max

V

DD

=V

DD

Min

V

DD

=V

DD

Max

V

DD

=V

DD

Max

I

OL

=100µA, V

DD

=V

DD

Min

I

OH

=-100µA, V

DD

=V

DD

Min

Min

Max

Unit

20

30

10

1

10

0.8

0.7 V

DD

V

DD

-0.3

0.2

V

DD

-0.2

mA

mA

µA

µA

µA

V

V

V

V

V

Table 5:

DC Characteristics (Cmos Compatible)

Recommended System Power-up Timing

Parameter

T

PU-READ

*

T

PU-WRITE

*

Description

Power-up to Read Operation

Power-up to Program/Erase Operation

Min

100

100

Unit

µs

µs

*

This parameter is measured only for initial qualification and after a design or process change that

could affect this parameter.

Table 6:

Recommended System Power-up Timing

Capacitance (Ta = 25°C, f = 1Mhz, other pins open)

Parameter

C

I/O

*

C

IN

*

Description

I/O Pin Capacitance

Input Capacitance

Test Conditons

V

I/O

=0V

V

IN

=0V

Max

12pF

6pF

*

This parameter is measured only for initial qualification and after a design or process change that

could affect this parameter.

Table 7:

Capacitance (Ta = 25

°

C, f = 1Mhz, Other Pins Open)

Reliability Characteristics

Symbol

N

END

*

T

DR

*

I

LTH

*

Parameter

Endurance

Data Retention

Latch Up

Min Specification

10,000

10

100+I

DD

Unit

Cycles

Years

mA

Test Method

JEDEC Standard A117

JEDEC Standard A103

JEDEC Standard 78

*

This parameter is measured only for initial qualification and after a design or process change that

could affect this parameter.

Table 8:

Reliability Characteristics

This specification is subject to change without further notice. (07.22.2004 V1.0)

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