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EN25F20-100GCP 参数 Datasheet PDF下载

EN25F20-100GCP图片预览
型号: EN25F20-100GCP
PDF下载: 下载PDF文件 查看货源
内容描述: 2兆位串行闪存与4KB的扇区制服 [2 Mbit Serial Flash Memory with 4Kbytes Uniform Sector]
分类和应用: 闪存存储内存集成电路光电二极管时钟
文件页数/大小: 33 页 / 1277 K
品牌: EON [ EON SILICON SOLUTION INC. ]
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EN25F20
EN25F20
2 Mbit Serial Flash Memory with 4Kbytes Uniform Sector
FEATURES
Single power supply operation
- Full voltage range: 2.7-3.6 volt
Serial Interface Architecture
- SPI Compatible: Mode 0 and Mode 3
2 Mbit Serial Flash
- 2 M-bit/256 K-byte/1024 pages
- 256 bytes per programmable page
High performance
- 100MHz clock rate
Low power consumption
- 12 mA typical active current
- 1
µA
typical power down current
-
-
-
Uniform Sector Architecture:
64 sectors of 4-Kbyte
4 blocks of 64-Kbyte
Any sector or block can be
erased individually
Software and Hardware Write Protection:
- Write Protect all or portion of memory via
software
- Enable/Disable protection with WP# pin
-
-
-
-
High performance program/erase speed
Page program time: 1.5ms typical
Sector erase time: 150ms typical
Block erase time 800ms typical
Chip erase time: 3 Seconds typical
Lockable 256 byte OTP security sector
Minimum 100K endurance cycle
Package Options
- 8 pins SOP 150mil body width
- 8 contact VDFN
- All Pb-free packages are RoHS compliant
Commercial and industrial temperature
Range
GENERAL DESCRIPTION
The EN25F20 is a 2M-bit (256K-byte) Serial Flash memory, with advanced write protection mechanisms,
accessed by a high speed SPI-compatible bus. The memory can be programmed 1 to 256 bytes at a
time, using the Page Program instruction.
The EN25F20 is designed to allow either single
Sector/Block
at a time or full chip erase operation. The
EN25F20 can be configured to protect part of the memory as the software protected mode. The device
can sustain a minimum of 100K program/erase cycles on each sector
or block.
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
2
©2004 Eon Silicon Solution, Inc.,
www.eonssi.com
Rev. F, Issue Date: 2010/05/25