100310
Absolute Maximum Ratings
(Note 1)
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Pin Potential to Ground Pin (V
EE
)
Input Voltage (DC)
Output Current (DC Output HIGH)
ESD (Note 2)
−65°C
to
+150°C
+150°C
−7.0V
to
+0.5V
V
EE
to
+0.5V
−50
mA
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Commercial
Industrial
Supply Voltage (V
EE
)
0°C to
+85°C
−40°C
to
+85°C
−5.7V
to
−4.2V
Note 1:
The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
Commercial Version
DC Electrical Characteristics
(Note 3)
V
EE
= −4.2V
to
−5.7V,
V
CC
=
V
CCA
=
GND, T
C
=
0
°
C to
+
85
°
C
Symbol
V
OH
V
OL
V
OHC
V
OLC
V
BB
V
DIFF
V
CM
V
IH
V
IL
I
IL
I
IH
I
CBO
I
EE
Parameter
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Output Reference Voltage
Input Voltage Differential
Common Mode Voltage
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
Input Leakage Current
Power Supply Current
−10
−100
−40
−1380
150
V
CC
−
2.0
−1165
−1830
0.50
240
V
CC
−
0.5
−870
−1475
−1320
Min
−1025
−1830
−1035
−1610
−1260
Typ
−955
−1705
Max
−870
−1620
Units
mV
mV
mV
mV
mV
mV
V
mV
mV
µA
µA
µA
mA
Guaranteed HIGH Signal for All Inputs
Guaranteed LOW Signal for All Inputs
V
IN
=
V
IL
(Min)
V
IN
=
V
IH
(Max)
V
IN
=
V
EE
Inputs Open
Conditions
V
IN
=
V
IH
(Max)
or V
IL
(Min)
V
IN
=
V
IH
or V
IL
(Max)
I
VBB
= −250 µA
Required for Full Output Swing
Loading with
50Ω to
−2.0V
Loading with
50Ω to
−2.0V
Note 3:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
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