Reliability Test Results
Test
cate-
gorie
s
Number
Reference
Number
of
norms
of test
failure
EIAJ ED-4701
sample
(Aug.-2001 edition)
sample
Test Method 401
MethodⅠ
Test Method 402
methodⅡ
Test Method 403
Condition code B
Test Method 404
Condition code B
Test Method 201
Test Method 202
Test Method 103
Test code C
Test Method 103
Test code E
Test Method 105
Test Method 307
method
Ⅰ
Condition code A
Test items
Mechanical Tests
1 Terminal Strength
(Pull test)
2 Mounting Strength
3 Vibration
4 Shock
1 High Temperature Storage
2 Low Temperature Storage
5
5
5
5
5
5
5
5
5
5
0
0
0
0
0
0
*
0
0
0
Environment Tests
3 Temperature Humidity
Storage
4 Unsaturated
Pressurized Vapor
5 Temperature Cycle
6 Thermal Shock
1 High temperature Reverse Bias
Test Method 101
5
5
5
5
*
0
*
0
Endurance Tests
2 High temperature Bias
( for gate )
3 Temperature Humidity Bias
4 Intermitted Operating Life
(Power cycling)
( for IGBT )
Test Method 101
Test Method 102
Condition code C
Test Method 106
* under confirmation
MS5F6136
8
13
H04-004-03a
FUJI [ FUJI ELECTRIC ]
