AC ELECTRICAL CHARACTERISTICS - RECLOCKER STAGE
V
CC
= 5V,
T
A
= 25°C
PARAMETER
Serial Input – Data Rate
Serial Input – Jitter Tolerance
Phase Lock Time -
Asynchronous
Phase Lock Time - Synchronous
CONDITIONS
SMPTE 292M
Sinewave Modulation (p – p)
Loop bandwidth approximately
1.4MHz @ 0.2 UI input jitter
modulation (LBCONT floating).
Loop bandwidth approximately
1.4MHz @ 0.2 UI input jitter
modulation (LBCONT floating).
Loop bandwidth approximately
1.4MHz @ 0.2 UI input jitter
modulation (LBCONT floating).
Loop bandwidth approximately
1.4MHz @ 0.2 UI input jitter
modulation (LBCONT floating).
SYMBOL
BR
SDI
J
TOL
T
ALOCK
MIN
1.485/1.001
0.5
-
TYP
1.485
0.6
120
MAX
-
-
145
UNITS
Gb/s
UI
ms
TEST
LEVEL
3
9
7
GS1545
T
SLOCK
-
2
3.2
µs
7
Carrier Detect Response Time
-
12
14
ms
7
Phase Lock/Unlock Time
(1nF PLCAP)
Digital Data Output (DDO) –
Signal Swing
Digital Data Output (DDO) –
Rise and Fall Time
Digital Data Output (DDO) –
Rise and Fall Time Mismatch
Digital Data Output (DDO) –
Intrinsic Jitter
Loop bandwidth
80
-
-
µs
7
V
DDO
t
R-DDO
, t
F-DDO
355
-
400
160
480
-
mV
ps
1
7
-
30
-
ps
7
(RMS Jitter for clean PRN 2
input on DDI/DDI inputs)
@ 0.2UI jitter modulation
LBCONT floating
23
–1
t
IJ
-
10
-
ps
9
1.2
1.4
1.5
MHz
7
Jitter peaking
TEST LEVELS
-
-
0.1
dB
7
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using
correlated test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
9. Indirect test.
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GENNUM CORPORATION
522 - 28 - 05
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