HANBit
3. Maximum Icc current specifications are tested with Vcc=Vcc max
HMF51232M4D
ERASE AND PROGRAMMING PERFORMANCE
LIMITS
PARAMETER
MIN.
Sector Erase Time
Chip Erase Time
Byte Programming Time
Chip Programming Time
Notes:
1.
Typical program and erase times assume the follwing conditions:25°,5.0Vcc,1,000,000cycles.
Additionally,programming typicals assume checkerboard pattern.
2.
3.
Under worst case conditions of 90°C, Vcc=4.5V(4.75V for-55), 1,000,000 cycles.
The typical chip programming time is considerably less than the maximum chip programming time listed, since most
bytes program faster than the maximum byte program time listed. If the maximum byte program time given is
exceeded, only then does the device set DQ5= 1. See the section os DQ5for further information.
4.
5.
In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See
Table 4 for further in formation on command definitions.
6.
The device has a guaranteed minimum erase and program cycle endurance of 1,000,000cycles.
-
-
-
TYP.
1
8
7
3.6
MAX.
8
64
300
10.8
sec
sec
us
sec
Excludes 00H programming
prior to erasure
Excludes system-level
overhead
UNIT
COMMENTS
CAPACITANCE
PARAMETER
SYMBOL
C
IN
C
OUT
C
IN2
PARAMETER
TEST SETUP
DESCRIPTION
Input Capacitance
Output Capacitance
Control Pin Capacitance
V
IN
= 0
V
OUT
= 0
V
IN
= 0
6
8.5
7.5
7.5
12
9
pF
pF
pF
TYP.
MAX
UNIT
Notes
: Test conditions T
A
= 25
o
C, f=1.0 MHz.
TEST CONDITIONS
TEST CONDITION
Output load
Output load Capacitance, C
L
Input Rise and Fall Times
Input Pulse Levels
30
5
0~3
-55
1 TTL gate
100
20
0.45~2.4
pF
ns
V
ALL OTHERS
UNIT
URL:
www.hbe.co.kr
REV.02(August,2002)
4
HANBit Electronics co., Ltd.
HANBIT [ HANBIT ELECTRONICS CO.,LTD ]
