HANBit
Vcc Active Write Current
Vcc Standby Current
Vcc Reset Current
Low Vcc Lock-Out Voltage
/CE = V
IL
, /OE=V
IH
/CE, RESET=V
CC
±0.3V
RESET=Vss±0.3V,
I
CC2
I
CC3
I
CC4
V
LKO
HMF8M8F4V/4VT
30
5
5
2.3
2.5
mA
mA
mA
V
ERASE AND PROGRAMMING PERFORMANCE
LIMITS
PARAMETER
MIN.
Sector Erase Time
-
TYP.
0.7
MAX.
Excludes 00H programming
15
Sec
prior to erasure
Byte Programming Time
-
9
300
µS
Excludes system-level
overhead
Excludes system-level
Chip Programming Time
-
18
54
sec
overhead
UNIT
COMMENTS
TSOP PIN CAPACITANCE
PARAMETER
SYMBOL
C
IN
C
OUT
C
IN2
PARAMETER
TEST SETUP
DESCRIPTION
Input Capacitance
Output Capacitance
Control Pin Capacitance
V
IN
= 0
V
OUT
= 0
V
IN
= 0
6
8.5
7.5
7.5
12
9
pF
pF
pF
TYP.
MAX
UNIT
Notes:
Test conditions T
A
= 25 C, f=1.0 MHz.
o
AC CHARACTERISTICS
u
Read Only Operations Characteristics
PARAMETER
-80
SYMBOLS
JEDEC
t
AVAV
t
AVQV
STANDARD
t
RC
t
ACC
Address to Output Delay
/OE = V
IL
t
ELQV
t
GLQV
t
CE
t
OE
Chip Enable to Output Delay
Chip Enable to Output Delay
/OE = V
IL
Max
Max
80
80
90
90
ns
ns
Read Cycle Time
/CE = V
IL
Max
80
90
ns
Min
80
90
ns
DESCRIPTION
TEST SETUP
(NOTE1)
(NOTE1)
-90
UNIT
URL:
www.hbe.co.kr
REV.02(August,2002)
4
HANBit Electronics Co., Ltd.