HANBit
t
EHQZ
t
GHQZ
t
AXQX
t
DF
t
DF
t
QH
/CE or /OE, Whichever Occurs First
Chip Enable to Output High-Z
Output Enable to Output High-Z
Output Hold Time From Addresses,
HMF8M8F4V/4VT
Max
Max
Min
25
25
0
30
30
0
ns
ns
ns
TEST CONDITIONS
Notes
: Test Conditions : Output Load : 1TTL gate and 100 pF
Input rise and fall times : 5 ns
Input pulse levels: 0V to 3.0V
Timing measurement reference level
Input : 1.5 V
Output : 1.5V
3.3V
2.7kΩ
Device
Under
Test
C
L
IN3064
or Equivalent
6.2kΩ
Diodes = IN3064
or Equivalent
Note
: C
L
= 100pF including jig capacitance
u
Erase/Program Operations
PARAMETER SYMBOLS
DESCRIPTION
JEDEC
t
AVAV
t
AVWL
t
WLAX
t
DVWH
t
WHDX
URL:
www.hbe.co.kr
REV.02(August,2002)
-80
Min
Min
Min
Min
Min
80
0
45
35
0
-90
90
0
45
45
0
UNIT
ns
ns
ns
ns
ns
STANDARD
t
WC
t
AS
t
AH
t
DS
t
DH
Write Cycle Time
Address Setup Time
Address Hold Time
Data Setup Time
Data Hold Time
5
HANBit Electronics Co., Ltd.
HANBIT [ HANBIT ELECTRONICS CO.,LTD ]
