欢迎访问ic37.com |
会员登录 免费注册
发布采购

HMN1M8DN-85I 参数 Datasheet PDF下载

HMN1M8DN-85I图片预览
型号: HMN1M8DN-85I
PDF下载: 下载PDF文件 查看货源
内容描述: 非易失性SRAM模块8Mbit的( 1,024KX 8位) , 40PIN DIP, 5V [Non-Volatile SRAM MODULE 8Mbit (1,024K X 8-Bit), 40Pin-DIP, 5V]
分类和应用: 存储内存集成电路静态存储器
文件页数/大小: 9 页 / 169 K
品牌: HANBIT [ HANBIT ELECTRONICS CO.,LTD ]
 浏览型号HMN1M8DN-85I的Datasheet PDF文件第1页浏览型号HMN1M8DN-85I的Datasheet PDF文件第3页浏览型号HMN1M8DN-85I的Datasheet PDF文件第4页浏览型号HMN1M8DN-85I的Datasheet PDF文件第5页浏览型号HMN1M8DN-85I的Datasheet PDF文件第6页浏览型号HMN1M8DN-85I的Datasheet PDF文件第7页浏览型号HMN1M8DN-85I的Datasheet PDF文件第8页浏览型号HMN1M8DN-85I的Datasheet PDF文件第9页  
HANBit
HMN1M8DN
FUNCTIONAL DESCRIPTION
The HMN1M8DN executes a read cycle whenever /WE is inactive(high) and /CE is active(low). The address specified by
the address inputs(A
0
-A
19
) defines which of the 1,048,576 bytes of data is accessed. Valid data will be available to the
eight data output drivers within t
ACC
(access time) after the last address input signal is stable.
When power is valid, the HMN1M8DN operates as a standard CMOS SRAM. During power-down and power-up cycles,
the HMN1M8DN acts as a nonvolatile memory, automatically protecting and preserving the memory contents.
The HMN1M8DN is in the write mode whenever the /WE and /CE signals are in the active (low) state after address inputs
are stable. The later occurring falling edge of /CE or /WE will determine the start of the write cycle. The write cycle is
terminated by the earlier rising edge of /CE or /WE. All address inputs must be kept valid throughout the write cycle. /WE
must return to the high state for a minimum recovery time (t
WR
) before another cycle can be initiated. The /OE control
signal should be kept inactive (high) during write cycles to avoid bus contention. However, if the output bus been enabled
(/CE and /OE active) then /WE will disable the outputs in t
ODW
from its falling edge.
The HMN1M8DN provides full functional capability for Vcc greater than 4.5 V and write protects by 4.37 V nominal. Power-
down/power-up control circuitry constantly monitors the Vcc supply for a power-fail-detect threshold V
PFD
. When V
CC
falls
below the V
PFD
threshold, the SRAM automatically write-protects the data. All inputs to the RAM become
“don’t
care” and
all outputs are high impedance. As Vcc falls below approximately 3 V, the power switching circuit connects the lithium
energy soure to RAM to retain data. During power-up, when Vcc rises above approximately 3.0 volts, the power switching
circuit connects external Vcc to the RAM and disconnects the lithium energy source. Normal RAM operation can resume
after Vcc exceeds 4.5 volts.
BLOCK DIAGRAM
PIN DESCRIPTION
A
0
-A
19
: Address Input
/OE
/WE
2 x 512K x 8
SRAM
Block
A
0
-A
18
/CE : Chip Enable
V
SS
: Ground
DQ
0
-DQ
7
: Data In / Data Out
/WE : Write Enable
DQ
0
-DQ
7
Power
/CE
A
19
/CE
CON
Power
Fail
Control
V
CC
/OE : Output Enable
V
CC
: Power (+5V)
Lithium
Cell
NC : No Connection
URL : www.hbe.co.kr
REV. 0.2 (August, 2002)
2
HANBit Electronics Co.,Ltd.