HN27C4000G Series
DC Characteristics (V = 6.25 V ± 0.25 V, V =12.5 V ± 0.3 V, Ta=25°C ± 5°C)
CC
PP
Item
Symbol
ILI
Min
Typ
—
Max
2
Unit
µA
mA
mA
V
Test conditions
Vin = 6.5 V/0.45 V
CE = VIL
Input leakage current
VPP supply current
Operating VCC current
Input voltage
—
IPP
—
—
40
ICC
—
—
50
VIL
–0.1*5
2.2
—
0.8
VIH
—
VCC
+ 0.5*6
V
Output voltage
VOL
VOH
—
—
—
0.45
—
V
V
IOL = 2.1 mA
2.4
IOH = –400 µA
Notes: 1. VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP
2. VPP must not exceed 13 V including overshoot.
.
3. An influence may be had upon device reliability if the device is installed or removed while VPP
12.5 V.
=
4. Do not alter VPP either VIL to 12.5 V or 12.5 V to VIL when CE = low.
5. VIL min = –0.6 V for pulse width ≤ 20 ns.
6. If VIH is over the specified maximum value, programming operation cannot be guaranteed.
AC Characteristics (V = 6.25 V ± 0.25 V, V = 12.5 V ± 0.3 V, Ta = 25°C ± 5°C)
CC
PP
Test Conditions
• Input pulse levels: 0.45 to 2.4 V
• Input rise and fall times: ≤ 20 ns
• Reference levels for measuring timings: 0.8 V, 2.0 V
Item
Symbol
tAS
Min
2
Typ
—
Max
—
Unit
µs
µs
µs
µs
µs
ns
µs
µs
µs
Test conditions
Address setup time
OE setup time
Data setup time
Address hold time
Data hold time
OE to output float delay
VPP setup time
VCC setup time
tOES
tDS
2
—
—
2
—
—
tAH
0
—
—
tDH
2
—
—
*1
tDF
0
—
130
—
tVPS
tVCS
tPW
2
—
2
—
—
CE initial programming
pulse width
47.5
50.0
52.5
Data valid from OE
tOE
0
—
150
ns
Note: 1. tDF is defined as the time at which the output achieves the open circuit condition and data is no
longer driven.
14
HITACHI [ HITACHI SEMICONDUCTOR ]
