HY57V651620B
ABSOLUTE MAXIMUM RATINGS
Parameter
Ambient Temperature
Storage Temperature
Voltage on Any Pin relative to V
S S
Voltage on V
D D
relative to V
S S
Short Circuit Output Current
Power Dissipation
Soldering Temperature
⋅
T i m e
T
A
T
S T G
V
IN
, V
O U T
V
DD,
V
D D Q
I
O S
P
D
T
SOLDER
Symbol
0 ~ 70
-55 ~ 125
-1.0 ~ 4.6
-1.0 ~ 4.6
50
1
260
⋅
10
Rating
°
C
°
C
V
V
mA
W
°
C
⋅
S e c
Unit
Note :
Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITION
Parameter
Power Supply Voltage
Input High Voltage
Input Low Voltage
Symbol
V
D D
, V
DDQ
V
IH
V
IL
( T A = 0 t o 7 0
°
C
)
Min
3.0
2.0
V
S S Q
- 2.0
Typ.
3.3
3.0
0
Max
3.6
V
DDQ
+ 2.0
0.8
Unit
V
V
V
Note
1,2
1,3
1,4
Note :
1.All voltages are referenced to V
SS
= 0 V
2.VDD(min) of HY57V651620B(L)TC-55/6/7 is 3.135V
3.V
IH
(max) is acceptable 5.6V AC pulse width with
≤
3ns of duration
4.V
IL
(min) is acceptable -2.0V AC pulse width with
≤
3ns of duration
AC OPERATING CONDITION
Parameter
AC Input High / Low Level Voltage
( T A = 0 t o 7 0
°
C
, V
D D
= 3 . 3
±
0 . 3 V
Note2
, V
SS
=0V)
Symbol
V
I H
/ V
IL
Vtrip
tR / tF
Voutref
CL
Value
2.4/0.4
1.4
1
1.4
50
Unit
V
V
ns
V
pF
Note
Input Timing Measurement Reference Level Voltage
Input Rise / Fall Time
Output Timing Measurement Reference Level
Output Load Capacitance for Access Time Measurement
1
Note :
1. Output load to measure access time is equivalent to two TTL gates and one capacitor (50pF)
For details, refer to AC/DC output circuit
2. VDD(min) of HY57V651620B(L)TC-55/6/7 is 3.135V
Rev. 1.9/Apr.01
4
HYNIX [ HYNIX SEMICONDUCTOR ]
