IDT7005S/L
HIGH-SPEED 8K x 8 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER THE
OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(1)(Cont'd.) (VCC = 5.0V ± 10%)
7005X35
7005X55
7005X70
Mil. Only
Test
Symbol
Parameter
Condition
Version
MIL.
Typ.(2) Max. Typ.(2) Max. Typ.(2) Max. Unit
ICC
Dynamic Operating
Current
CE = VIL, Outputs Open
SEM = VIH
S
L
150
140
300
250
150
140
300
250
140
130
300 mA
250
(3)
(Both Ports Active)
f = fMAX
COM’L.
MIL.
S
L
150
140
250
210
150
140
250
210
—
—
—
—
ISB1
ISB2
Standby Current
(Both Ports — TTL
CEL = CER = VIH
SEMR = SEML = VIH
S
L
13
10
80
65
13
10
80
65
10
10
80 mA
65
(3)
Level Inputs)
f = fMAX
COM’L.
MIL.
S
L
13
10
60
50
13
10
60
50
—
—
—
—
(5)
Standby Current
(One Port — TTL
Level Inputs)
CE"A"=VIL and CE"B"=VIL
S
L
85
75
85
75
190
160
155
130
85
75
85
75
190
160
155
130
80
70
—
—
190 mA
Active Port Outputs Open
160
—
(3)
f = fMAX
COM’L.
S
L
SEMR = SEML = VIH
—
ISB3
ISB4
Full Standby Current
(Both Ports — All
Both Ports CEL and
CER > VCC - 0.2V
MIL.
S
L
1.0
0.2
30
10
1.0
0.2
30
10
1.0
0.2
30 mA
10
CMOS Level Inputs)
VIN > VCC - 0.2V or
COM’L.
S
L
1.0
0.2
15
5
1.0
0.2
15
5
—
—
—
—
VIN < 0.2V, f = 0(4)
SEMR = SEML > VCC - 0.2V
Full Standby Current
(One Port — All
One Port CE"A" < 0.2V
CE"B" > VCC - 0.2V(5)
MIL.
S
80
175
80
175
75
175 mA
CMOS Level Inputs)
SEMR = SEML > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < 0.2V
L
70
80
150
135
70
80
150
135
65
—
150
—
COM’L.
S
Active Port Outputs Open,
f = fMAX
L
70
110
80
110
—
—
(3)
NOTES:
2738 tbl 10
1. "X" in part numbers indicates power rating (S or L).
2. VCC = 5V, TA = +25°C and are not production tested. ICC DC = 120mA (typ.)
3. At f = fMAX, address and I/O'S are cycling at the maximum frequency read cycle of 1/tRC, and using “AC Test Conditions” of input levels of GND to 3V.
4. f = 0 means no address or control lines change.
5. Port "A" may be either left or right port. Port "B" is the port opposite port "A".
DATA RETENTION CHARACTERISTICS OVER ALL TEMPERATURE RANGES (L Version Only)
(VLC = 0.2V, VHC = VCC - 0.2V)(4)
Symbol
Parameter
VCC for Data Retention
Data Retention Current
Test Condition
VCC = 2V
Min.
2.0
—
Typ.(1)
—
Max.
—
Unit
V
VDR
ICCDR
CE > VHC
MIL.
100
100
—
4000
1500
—
µA
VIN > VHC or ≤ VLC
SEM > VHC
COM’L.
—
(3)
tCDR
Chip Deselect to Data Retention Time
Operation Recovery Time
0
ns
(3)
(2)
tR
tRC
—
—
ns
NOTES:
2738 tbl 11
1. TA = +25°C, VCC = 2V, and are not production tested.
2. tRC = Read Cycle Time
3. This parameter is guaranteed by device characteriation, but is not production tested.
DATA RETENTION WAVEFORM
DATA RETENTION MODE
V
DR
≥
VCC
4.5V
4.5V
2V
t
CDR
tR
V
DR
V
IH
VIH
CE
2738 drw 05
6.06
6
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
