ML145053
LANSDALE Semiconductor, Inc.
A/D CONVERTER ELECTRICAL CHARACTERISTICS
(Full Temperature and Voltage Ranges per Operation Ranges Table)
Characteristic
Resolution
Maximum Nonlinearity
Maximum Zero Error
Maximum Full-Scale Error
Maximum Total Unadjusted Error
Maximum Quantization Error
Absolute Accuracy
Maximum Conversion Time
Data Transfer Time
Sample Acquisition Time
Minimum Total Cycle Time
Maximum Sample Rate
Definition and Test Conditions
Number of bits resolved by the A/D converter
Maximum difference between an ideal and an actual ADC transfer function
Difference between the maximum input voltage of an ideal and an actual
ADC for zero output code
Difference between the minimum input voltage of an ideal and an actual
ADC for full-scale output code
Maximum sum of nonlinearity, zero error, and full-scale error
Uncertainty due to converter resolution
Difference between the actual input voltage and the full-scale weighted
equivalent of the binary output code, all error sources included
Total time to perform a single analog-to-digital conversion
Total time to transfer digital serial data into and out of the device
Analog input acquisition time window
Total time to transfer serial data, sample the analog input, and perform the
conversion; SCLK = 2.1 MHz
Rate at which analog inputs may be sampled; SCLK = 2.1 MHz
Guaranteed
Limit
10
±
1
±
1
±
1
±
1
±
1/2
±
1-1/2
44
10 to 16
6
49
20.4
Unit
Bits
LSB
LSB
LSB
LSB
LSB
LSB
µs
SCLK
cycles
SCLK
cycles
µs
ks/s
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