Specifications
GAL26CV12C
Specifications
GAL26CV12
AC Switching Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
COM
PARAM
TEST
COND.
1
IND
DESCRIPTION
MIN.
Input or I/O to Comb. Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Fdbk before Clk
↑
Setup Time, SP before Clock
↑
Hold Time, Input or Fdbk after Clk
↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynch. Reset of Reg.
Asynchronous Reset Pulse Duration
Asynch. Reset to Clk↑ Recovery Time
Synch. Preset to Clk
↑
Recovery Time
1
1
—
6
6
0
95.2
-7
MAX.
7.5
4.5
2.5
—
—
—
—
-10
MIN. MAX.
1
1
—
7
7
0
71.4
10
7
2.5
—
—
—
—
UNITS
ns
ns
ns
ns
ns
ns
MHz
t
pd
t
co
t
cf
2
t
su
1
t
su
2
t
h
A
A
—
—
—
—
A
f
max
3
A
A
117.6
142.8
—
—
105
105
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
3.5
3.5
1
1
1
7
5
5
—
—
7.5
7.5
9
—
—
—
4
4
1
1
1
8
8
10
—
—
10
9
13
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Specification
section.
3) Refer to
fmax Specification
section.
Capacitance (T
A
= 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
7
LATTICE [ LATTICE SEMICONDUCTOR ]
