ABSOLUTE MAXIMUM RATINGS
INDUSTRIAL OPERATING RANGES
Ambient Temperature (TA)
Operating in Free Air . . . . . . . . . . . . –40°C to +85°C
Storage Temperature . . . . . . . . . . . . 65°C to +150°C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . –55°C to +125°C
Supply Voltage (VCC) with
Respect to Ground . . . . . . . . . . . . . . +4.5 V to +5.5 V
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC Input Voltage . . . . . . . . . . . . –0.5 V to VCC+ 0.5 V
DC Output or
I/O Pin Voltage . . . . . . . . . . . . . –0.5 V to VCC+ 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current
(TA = –40°C to +85°C) . . . . . . . . . . . . . . . . . . 200 mA
Stressesabove those listed under Absolute MaximumRatings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
DC CHARACTERISTICS over INDUSTRIAL operating ranges unless otherwise specified
Parameter
Symbol
Parameter Description
Test Conditions
Min Typ Max Unit
VOH
Output HIGH Voltage
IOH= –3.2 mA, VCC = Min
VIN = VIH or VIL
2.4
V
VOL
VIH
VIL
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
IOL= 16 mA, VCC = Min
VIN = VIH or VIL
0.5
V
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
2.0
V
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
0.8
10
V
IIH
IIL
Input HIGH Leakage Current
Input LOW Leakage Current
VIN = 5.25 V, VCC = Max (Note 2)
VIN = 0 V, VCC = Max (Note 2)
µA
–100 µA
10 µA
IOZH
Off-State Output Leakage
Current HIGH
VOUT= 5.25 V, VCC = Max
VIN = VIH or VIL (Note 2)
IOZL
Off-State Output Leakage
Current LOW
VOUT= 0 V, VCC = Max
VIN = VIH or VIL (Note 2)
–100 µA
ISC
ICC
Output Short-Circuit Current
Supply Current (Typical)
VOUT= 0.5 V, VCC = Max (Note 3)
–30
–130 mA
mA
VCC = 5 V, TA = 25°C, f = 25 MHz (Note 4)
205
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL(or IIH and IOZH).
3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second.
VOUT= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
4. Measured with a 12-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of
being loaded, enabled, and reset.
14
MACH220-14/18/24 (Ind)
LATTICE [ LATTICE SEMICONDUCTOR ]
