SYMBOL
INPUT CURRENT
*SCAN RESET/LOAD
**All Count inputs
I
IH
I
IL
I
IH
I
IL
MIN
-
-
-
-
MAX
-3.5
-5
5
1
UNIT
µA
µA
µA
µA
CONDITIONS
V
DD
= Max, V
IH
= +3.5V
V
DD
= Max, V
IL
= 0V
V
DD
= Max, V
IH
= +3.5V
V
DD
= Max, V
IL
= 0.35V
*Input has internal pull-up resistor to V
DD
** Inputs have internal pull-down resistor to V
SS
DYNAMIC ELECTRICAL CHARACTERISTICS:
(V
DD
= +5V ± 5%, V
SS
= 0
V
, T
A
= 0˚C to +70˚C unless otherwise noted.)
PARAMETER
Count Frequency
(All Count inputs)
Count Pulse Width
(All Count Inputs)
Count Ripple Time
SYMBOL
fc
t
CPW
MIN
DC
10
MAX
50
-
UNIT
MHz
ns
CONDITIONS
-
Measured at 50% point,
Max tr, t
f
= 1ns
Transition from 32 ones to 32 zeros
from negative edge of count pulse
Measured at 50% point
Max t
r
, t
f
= 10ns
t
CR
-
20
ns
Reset Pulse Width
(All Counter Stages
Fully Reset)
RESET Removal Time
(Reset Removed From
All Counter Stages)
SCAN Frequency
SCAN Pulse Width
SCAN RESET/LOAD
Pulse Width
(All latches loaded and
Scan Counter Reset to
Least Significant Byte)
SCAN RESET/LOAD
Removal Time
(Reset Removed from
Scan Counter; Load
Command Removed
From Latches)
Output Disable
Delay Time
(B0 - B7)
t
RPW
20
-
ns
t
RR
-
10
ns
Measured from RESET signal at V
IH
f
SC
t
SCPW
t
RSCPW
-
50
10
10
-
-
MHz
ns
ns
Measured at 50% point
Max t
r
, t
f
= 10ns
Measured at 50% point
Max t
r
, t
f
= 5ns
t
RSCR
-
10
ns
Measured from
SCAN RESET/LOAD at V
IH
t
DOD
-
5
ns
Transition to Output High
Impedance State Measured
From Scan at V
IL
or
ENABLE at V
IH
Transition to Valid On State
Measured from Scan at V
IH
and ENABLE at V
IL
; Delay to
Valid Data Levels for C
OL
= 10pF
and one TTL Load or Valid Data
Currents for High Capacitance Loads
Negative Transition from Scan at V
IL
and ST5 of Scan Counter or Positive
Transition From SCAN RESET/LOAD at
V
IL
to Valid Data Levels for C
OL
= 12pF
and one TTL Load
Output ENABLE
Delay Time
(B0 - B7)
t
DOE
-
5
ns
Output Delay Time
CASCADE ENABLE
t
DCE
-
10
ns
7060C/61C-121901-3
LSI [ LSI COMPUTER SYSTEMS ]
