®
LY6251216
Rev. 1.0
512K X 16 BIT LOW POWER CMOS SRAM
DC ELECTRICAL CHARACTERISTICS
SYMBOL
TEST CONDITION
PARAMETER
Supply Voltage
V
CC
*1
Input High Voltage
V
IH
*2
Input Low Voltage
V
IL
Input Leakage Current
I
LI
V
CC
≧
V
IN
≧
V
SS
Output Leakage
V
CC
≧
V
OUT
≧
V
SS
I
LO
Current
Output Disabled
Output High Voltage
V
OH
I
OH
= -1mA
Output Low Voltage
V
OL
I
OL
= 2mA
Cycle time = Min.
- 55
CE# = V
IL
,
I
CC
I
I/O
= 0mA
- 70
Average Operating
Other pins at V
IL
or V
IH
Power supply Current
Cycle time = 1µs
I
CC1
CE#
≦
0.2V, I
I/O
= 0mA
Other pins at 0.2V or V
CC
-0.2V
CE# = V
IH
I
SB
Other pins at V
IL
or V
IH
Standby Power
-LL
Supply Current
CE#
≧
V
CC
-0.2V
I
SB1
Other pins at 0.2V or V
CC
-0.2V -LLI
Notes:
1. V
IH
(max) = V
CC
+ 2.0V for pulse width less than 6ns.
2. V
IL
(min) = V
SS
- 2.0V for pulse width less than 6ns.
3. Over/Undershoot specifications are characterized, not 100% tested.
4. Typical values are included for reference only and are not guaranteed or tested.
Typical values are measured at V
CC
= V
CC
(TYP.) and T
A
= 25℃
MIN.
4.5
2.4
- 0.2
-1
-1
2.4
-
-
-
-
-
-
-
TYP.
5.0
-
-
-
-
-
-
45
30
6
0.2
8
8
*4
MAX.
5.5
V
CC
+0.3
0.6
1
1
-
0.4
60
50
12
2
30
50
UNIT
V
V
V
µA
µA
V
V
mA
mA
mA
mA
µA
µA
CAPACITANCE
(T
A
= 25
℃
, f = 1.0MHz)
PARAMETER
Input Capacitance
Input/Output Capacitance
SYMBOL
C
IN
C
I/O
MIN.
-
-
MAX
6
8
UNIT
pF
pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Reference Levels
Output Load
0.2V to V
CC
- 0.2V
3ns
1.5V
C
L
= 30pF + 1TTL, I
OH
/I
OL
= -1mA/2mA
Lyontek Inc.
reserves the rights to change the specifications and products without notice.
5F, No. 2, Industry E. Rd. IX, Science-Based Industrial Park, Hsinchu 300, Taiwan.
TEL: 886-3-6668838
FAX: 886-3-6668836
4
LYONTEK [ Lyontek Inc. ]
