27C010T
1 Megabit (128K x 8-Bit) - OTP EPROM
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TABLE 7. 27C010T AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION
(VCC = 5V ± 10%, VPP = VSS, TA = -55 TO +125 °C, UNLESS OTHERWISE SPECIFIED)
PARAMETER
TEST CONDITION
SYMBOL
SUB GROUPS
MIN
MAX
UNIT
Address Access Time
CE = OE = VIL
tACC
9, 10, 11
ns
- 120
- 150
- 200
--
--
--
120
150
200
Chip Enable Access Time
OE = VIL
tCE
tOE
tOH
tDF
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
ns
ns
ns
ns
- 120
- 150
- 200
--
--
--
120
150
200
Output Enable Access TIme
CE = VIL
- 120
- 150
- 200
--
--
--
60
70
70
Output Hold to Address Change
CE = VIL
- 120
- 150
- 200
0
0
0
--
--
--
Output Disable to High-Z 2
CE = OE = VIL
- 120
- 150
- 200
0
0
0
50
50
50
1. Test conditions:
- Input pulse levels 0.45V/2.4V
- Input rise and fall times < 10 ns
- Output load 1 TTL gate + 100 pF (including scope and jig)
- Referenced levels for measuring timing 0.8V/2.0V
2. tDF is defined as the time at which the output becomes an open circuit and data is no longer driven.
12.12.01 Rev 2
All data sheets are subject to change without notice
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