MX29F080
CAPACITANCE (TA = 25oC, f = 1.0 MHz)
SYMBOL
CIN1
PARAMETER
MIN.
TYP
MAX.
8
UNIT
pF
CONDITIONS
VIN = 0V
Input Capacitance
Control Pin Capacitance
Output Capacitance
CIN2
12
pF
VIN = 0V
COUT
12
pF
VOUT = 0V
READ OPERATION
DC CHARACTERISTICS (TA = 0°CTO 70°C,VCC = 5V±10%)
SYMBOL PARAMETER
MIN.
TYP
MAX.
±1
±1
1
UNIT
uA
uA
mA
uA
mA
mA
V
CONDITIONS
ILI
Input Leakage Current
VIN = GND to VCC
VOUT = GND to VCC
CE = VIH
ILO
Output Leakage Current
Standby VCC current
ISB1
ISB2
ICC1
ICC2
VIL
0.2
5
CE = VCC + 0.3V
IOUT = 0mA, f=1MHz
IOUT = 0mA, f=10MHz
Operating VCC current
30
50
0.8
Input Low Voltage
-0.3(NOTE 1)
2.0
VIH
Input High Voltage
VCC + 0.3
0.45
V
VOL
VOH1
VOH2
Output Low Voltage
Output High Voltage(TTL)
V
IOL = 2.1mA
IOH = -2mA
2.4
V
Output High Voltage(CMOS) VCC-0.4
V
IOH = -100uA,
VCC=VCC MIN
NOTES:
1. VIL min. = -1.0V for pulse width < 50 ns.
VIL min. = -2.0V for pulse width < 20 ns.
2. VIH max. = VCC + 1.5V for pulse width < 20 ns.
If VIH is over the specified maximum value, read operation
cannot be guaranteed.
AC CHARACTERISTICS (TA = 0oC to 70oC,VCC = 5V±10%)
29F080-70*
29F080-90
29F080-12
SYMBOL PARAMETER
MIN. MAX. MIN. MAX. MIN. MAX.
UNIT
ns
CONDITIONS
CE=OE=VIL
OE=VIL
tACC
tCE
tOE
tDF
Address to Output Delay
70
70
40
20
90
90
40
30
120
120
50
CE to Output Delay
ns
OE to Output Delay
ns
CE=VIL
OE High to Output Float (Note1)
Address to Output hold
0
0
0
0
0
0
30
ns
CE=VIL
tOH
ns
CE=OE=VIL
TEST CONDITIONS:
NOTE:
•
•
•
•
Input pulse levels: 0.45V/2.4V*
Input rise and fall times is equal to or less than 0ns
1. tDF is defined as the time at which the output achieves the
open circuit condition and data is no longer driven.
* For -70, the input levels : 0.0/3.0V, the output load : 1TTL
gate+30pF (including scope and jig)
Output load: 1 TTL gate + 100pF* (Including scope and jig)
Reference levels for measuring timing: 0.8V, 2.0V
P/N:PM0579
REV. 1.4, JAN. 16, 2002
14
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