MCP3021
Note:
Unless otherwise indicated, V
DD
= 5V, V
SS
= 0V, I
2
C Fast Mode Timing (SCL = 400 kHz), Continuous Conversion
Mode (f
SAMP
= 22.3 ksps), T
A
= +25°C.
2.1
1000
100
10
I
DDS
(nA)
1
0.1
0.01
0.001
0.0001
-50
-25
0
25
50
75
100
125
Temperature (°C)
Test Circuit
V
DD
= 5V
10 µF
0.1 µF
2 kΩ
2 kΩ
AIN
V
IN
V
DD
MCP3021
SDA
V
SS
SCL
FIGURE 2-37:
Temperature.
2
1.8
Analog Input Leakage (nA)
1.6
1.4
1.2
1
0.8
0.6
0.4
0.2
0
-50
-25
0
I
DDS
(Standby) vs.
V
CM
= 2.5V
FIGURE 2-39:
Typical Test Configuration.
25
50
75
100
125
Temperature (°C)
FIGURE 2-38:
Temperature.
Analog Input Leakage vs.
2003 Microchip Technology Inc.
DS21805A-page 11