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MCP3021A5T-E/OT 参数 Datasheet PDF下载

MCP3021A5T-E/OT图片预览
型号: MCP3021A5T-E/OT
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗10位A / D转换器, I2C⑩接口 [Low Power 10-Bit A/D Converter With I2C⑩ Interface]
分类和应用: 转换器
文件页数/大小: 26 页 / 546 K
品牌: MICROCHIP [ MICROCHIP ]
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MCP3021  
4.5  
Differential Non-Linearity (DNL)  
4.8  
Gain Error  
In the ideal ADC transfer function, each code has a uni-  
form width. That is, the difference in analog input volt-  
age is constant from one code transition point to the  
next. DNL specifies the deviation of any code in the  
transfer function from an ideal code width of 1 LSB.  
The DNL is determined by subtracting the locations of  
successive code transition points after compensating  
for any gain and offset errors. A positive DNL implies  
that a code is longer than the ideal code width, while a  
negative DNL implies that a code is shorter than the  
ideal width.  
The gain error determines the amount of deviation from  
the ideal slope of the ADC transfer function. Before the  
gain error is determined, the offset error is measured  
and subtracted from the conversion result. The gain  
error can then be determined by finding the location of  
the last code transition and comparing that location to  
the ideal location. The ideal location of the last code  
transition is 1.5 LSBs below full-scale or V  
.
DD  
4.9  
Conversion Current (I  
)
DD  
The average amount of current over the time required  
to perform a 10-bit conversion.  
4.6  
Integral Non-Linearity (INL)  
4.10 Active Bus Current (I  
)
INL is a result of cumulative DNL errors and specifies  
how much the overall transfer function deviates from a  
linear response. The method of measurement used in  
the MCP3021 ADC to determine INL is the “end-point”  
method.  
DDA  
The average amount of current over the time required  
2
to monitor the I C bus. Any current the device con-  
sumes while it is not being addressed is referred to as  
Active Bus current.  
4.7  
Offset Error  
4.11 Standby Current (I  
The average amount of current required while no con-  
version is occurring and while no data is being output  
(i.e., SCL and SDA lines are quiet).  
)
DDS  
Offset error is defined as a deviation of the code transi-  
tion points that are present across all output codes.  
This has the effect of shifting the entire A/D transfer  
function. The offset error is measured by finding the dif-  
ference between the actual location of the first code  
transition and the desired location of the first transition.  
The ideal location of the first code transition is located  
2
4.12 I C Standard Mode Timing  
2
I C specification where the frequency of SCL is  
at 1/2 LSB above V  
.
100 kHz.  
SS  
2
4.13 I C Fast Mode Timing  
2
I C specification where the frequency of SCL is  
400 kHz.  
DS21805A-page 14  
2003 Microchip Technology Inc.