5076 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement parameter: I
DD
I
DD
A
Measurement Circuit 4
Measurement parameter: R
VIN
VDD
VDD
Crystal
I
VIN
A
XT
XTN
R
VIN
=
V
DD
I
VIN
XT
XTN
VC
0.1µF
Q
VC
VSS
VSS
Measurement Circuit 5
Measurement Circuit 2
Measurement parameter: V
OH
, V
OL
VDD
XT
Signal
Generator
0.001µF
XT
Measurement parameter: C
VIN
, Z
VIN
VDD
0.1µF
50Ω
Q
XTN
Q
50Ω
XTN
VC
VSS
V
OH
V
OL
V
0.1µF
V
S
Impedance
Analyzer
(HP 4194A)
VC
VSS
∆V
V
OH
V
S
V
S
V
OL
VC input signal: 100Hz to 10kHz, 0.1Vp-p
∆V
Measurement Circuit 6
Measurement parameter: fm
VDD
Crystal
Modulation
signal
V
S
adjusted such that
∆V
=
50
×
I
OH
.
XT input signal: 1Vp-p, sine wave
V
S
adjusted such that
∆V
=
50
×
I
OL
.
XT
0.1µF
Q
XTN
R1
VC
R2
Measurement Circuit 3
Measurement parameter: R
VC1
, R
VC2
Gain-phase
Analyzer
(HP 4194A)
Modulaiton
Analyzer
(HP 8901B)
C1
VSS
C
LOUT
= 15pF
Demodulation
signal
I
XT
A
XT
XTN
VC
VDD
I
XTN
A
XT
XTN
VC
VDD
C1 = 33µF, R1 = R2 = 1MΩ
VC modulation signal: 100Hz to 100kHz, 0 to V
DD
p-p
Measurement Circuit 7
VSS
VSS
Measurement parameter: Duty, t
r
, t
f
R
VC
1
=
V
DD
I
XT
R
VC
2
=
V
DD
I
XTN
Crystal
VDD
XT
XTN
VC
0.1µF
Q
VSS
C
LOUT
= 15pF
(Including probe
capacitance)
SEIKO NPC CORPORATION —8
NPC [ NIPPON PRECISION CIRCUITS INC ]
