M29W800DT, M29W800DB
Figure 10. AC measurement load circuit
VCC
VCC
DC and AC parameters
25kΩ
DEVICE
UNDER
TEST
25kΩ
0.1µF
CL
CL includes JIG capacitance
AI04499
Table 10.
Symbol
C
IN
C
OUT
Device capacitance
(1)
Parameter
Input capacitance
Output capacitance
Test condition
V
IN
= 0 V
V
OUT
= 0 V
Min
Max
6
12
Unit
pF
pF
1. Sampled only, not 100% tested.
Table 11.
Symbol
I
LI
I
LO
I
CC1
I
CC2
I
CC3 (1)
V
IL
V
IH
V
OL
V
OH
V
ID
I
ID
V
LKO
DC characteristics
Parameter
Input leakage current
Output leakage current
Supply current (read)
Supply current (standby)
Supply current (program/erase)
Input low voltage
Input high voltage
Output low voltage
Output high voltage
Identification voltage
Identification current
Program/erase lockout supply
voltage
A9 = V
ID
1.8
I
OL
= 1.8 mA
I
OH
= –100
µ
A
V
CC
– 0.4
11.5
12.5
100
2.3
Test condition
0 V
≤
V
IN
≤
V
CC
0 V
≤
V
OUT
≤
V
CC
E = V
IL
, G = V
IH
,
f = 6 MHz
E = V
CC
± 0.2 V,
RP = V
CC
± 0.2 V
Program/erase
controller active
–0.5
0.7V
CC
Min
Max
±1
±1
10
100
20
0.8
V
CC
+ 0.3
0.45
Unit
µ
A
µ
A
mA
µ
A
mA
V
V
V
V
V
µ
A
V
1. Sampled only, not 100% tested.
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