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M29W800DB45ZE1F 参数 Datasheet PDF下载

M29W800DB45ZE1F图片预览
型号: M29W800DB45ZE1F
PDF下载: 下载PDF文件 查看货源
内容描述: 8兆位( 1兆位×8或512千位×16 ,引导块) 3 V电源快闪记忆体 [8-Mbit (1 Mbit x 8 or 512 Kbits x 16, boot block) 3 V supply flash memory]
分类和应用: 闪存存储内存集成电路
文件页数/大小: 52 页 / 1105 K
品牌: NUMONYX [ NUMONYX B.V ]
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Command interface  
M29W800DT, M29W800DB  
(1)  
Table 5.  
Commands, 8-bit mode, BYTE = V  
IL  
Bus write operations  
3rd 4th  
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data  
Command  
1st  
2nd  
5th  
6th  
1
3
3
4
3
X
F0  
AA  
AA  
AA  
AA  
Read/Reset  
AAA  
AAA  
AAA  
AAA  
555  
555  
555  
555  
55  
55  
55  
55  
X
F0  
90  
A0  
20  
Auto Select  
Program  
AAA  
AAA  
AAA  
PA  
PD  
Unlock Bypass  
Unlock Bypass  
Program  
2
X
A0  
PA  
PD  
Unlock Bypass Reset  
Chip Erase  
2
6
X
90  
AA  
AA  
B0  
30  
98  
X
00  
55  
55  
AAA  
555  
555  
AAA  
AAA  
80  
80  
AAA  
AAA  
AA  
AA  
555  
555  
55  
55  
AAA  
BA  
10  
30  
Block Erase  
6+ AAA  
Erase Suspend  
Erase Resume  
Read CFI Query  
1
1
1
X
X
AA  
1. X don’t care, PA program address, PD program data, BA any address in the block.  
All values in the table are in hexadecimal.  
The command interface only uses A–1, A0-A10 and DQ0-DQ7 to verify the commands; A11-A18, DQ8-DQ14 and DQ15  
are don’t care. DQ15A–1 is A–1 when BYTE is VIL or DQ15 when BYTE is VIH  
.
Table 6.  
Program, erase times and program, erase endurance cycles  
Parameter  
Min.  
Typ. (1)(2)  
Max.(2)  
Unit  
Chip erase  
12  
0.8  
15  
10  
12  
6
60(3)  
6(4)  
s
s
Block erase (64 Kbytes)  
Erase suspend latency time  
Program (byte or word)  
25(3)  
200(3)  
60(3)  
30(4)  
µs  
µs  
Chip program (byte by byte)  
Chip program (word by word)  
Program/erase cycles (per block)  
Data retention  
s
s
100,000  
20  
cycles  
years  
1. Typical values measured at room temperature and nominal voltages.  
2. Sampled, but not 100% tested.  
3. Maximum value measured at worst case conditions for both temperature and VCC after 100,000 program/erase cycles.  
4. Maximum value measured at worst case conditions for both temperature and VCC  
.
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