PO74G2305A
3.3V 1:5 CMOS Clock Buffered Driver
750MHz TTL/CMOS Potato Chip
10/05/07
Maximum Ratings
Description
Storage Temperature
Operation Temperature
Operation Voltage
Input Voltage
Output Voltage
Max
-65 to 150
-40 to 85
-0.5 to +4.6
-0.5 to +5.5
-0.5 to Vcc+0.5
Unit
°C
°C
V
V
V
Note:
stresses greater than listed under
Maximum
Ratings
may
cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
DC Electrical Characteristics
Symbol
Description
Output High voltage
Output Low voltage
Input High voltage
Input Low voltage
Input High current
Input Low current
Clamp diode voltage
Test Conditions
Vcc=3V Vin=V
IH
or V
IL
, I
OH
= -12mA
Vcc=3V Vin=V
IH
or V
IL
, I
OH
=12mA
Guaranteed Logic HIGH Level (Input Pin)
Guaranteed Logic LOW Level (Input Pin)
Vcc = 3.6V and Vin = 5.5V
Vcc = 3.6V and Vin = 0V
Vcc = Min. And
I
IN
= -18mA
Min
Typ
Max
Unit
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
V
IK
Notes:
1.
2.
3.
4.
5.
2.4
-
2
-0.5
-
-
-
3
0.3
-
-
-
-
-0.7
-
0.5
Vcc
0.8
5
-5
-1.2
V
V
V
V
uA
uA
V
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25
°C
ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
VoH = Vcc – 0.6V at rated current
2
Copyright
© 2007, Potato Semiconductor Corporation
POTATO [ POTATO SEMICONDUCTOR CORPORATION ]
