K7N403609B
K7N401809B
PARAMETER
Input Leakage Current(except ZZ)
Output Leakage Current
Operating Current
SYMBOL
I
IL
I
OL
I
CC
128Kx36 & 256Kx18 Pipelined NtRAM
TM
TEST CONDITIONS
V
DD
=Max ; V
IN
=V
SS
to V
DD
Output Disabled,
V
DD
=Max , I
OUT
=0mA
ZZ≤V
IL ,
Cycle Time
≥
t
CYC
Min
Device deselected, I
OUT
=0mA,
ZZ≤V
IL
, f=Max,
All Inputs≤0.2V or
≥
V
DD
-0.2V
-20
-20
MIN
-2
-2
-
-
-
-
-
2.4
-
2.0
-0.3*
2.0
-0.3*
1.7
MAX
+2
+2
330
150
80
50
0.4
-
0.4
-
0.8
V
DD
+0.3**
0.7
V
DD
+0.3**
UNIT
µA
µA
mA
mA
mA
mA
V
V
V
V
V
V
V
V
3
3
1,2
NOTES
DC ELECTRICAL CHARACTERISTICS
(V
DD
=3.3V+0.165V/-0.165V, T
A
=0°C to +70°C)
I
SB
Standby Current
I
SB1
I
SB2
Output Low Voltage(3.3V I/O)
Output High Voltage(3.3V I/O)
Output Low Voltage(2.5V I/O)
Output High Voltage(2.5V I/O)
Input Low Voltage(3.3V I/O)
Input High Voltage(3.3V I/O)
Input Low Voltage(2.5V I/O)
Input High Voltage(2.5V I/O)
V
OL
V
OH
V
OL
V
OH
V
IL
V
IH
V
IL
V
IH
Device deselected, I
OUT
=0mA, ZZ≤0.2V, f=0,
All Inputs=fixed (V
DD
-0.2V or 0.2V)
Device deselected, I
OUT
=0mA, ZZ≥V
DD
-0.2V,
f=Max, All Inputs≤V
IL
or
≥V
IH
I
OL
=8.0mA
I
OH
=-4.0mA
I
OL
=1.0mA
I
OH
=-1.0mA
Notes :
1.The above parameters are also guaranteed at industrial temperature range.
2. Reference AC Operating Conditions and Characteristics for input and timing.
3. Data states are all zero.
4. In Case of I/O Pins, the Max. V
IH
=V
DDQ
+0.3V
V
IH
V
SS
V
SS-
1.0V
20% t
CYC
(MIN)
TEST CONDITIONS
(V
DD
=3.3V+0.165V/-0.165V,V
DDQ
=3.3V+0.165/-0.165V or V
DD
=3.3V+0.165V/-0.165V,V
DDQ
=2.5V+0.4V/-0.125V, T
A
=0to70°C)
PARAMETER
Input Pulse Level(for 3.3V I/O)
Input Pulse Level(for 2.5V I/O)
Input Rise and Fall Time(Measured at 20% to 80% for 3.3V I/O)
Input Rise and Fall Time(Measured at 20% to 80% for 2.5V I/O)
Input and Output Timing Reference Levels for 3.3V I/O
Input and Output Timing Reference Levels for 2.5V I/O
Output Load
* The above parameters are also guaranteed at industrial temperature range.
VALUE
0 to 3.0V
0 to 2.5V
1.0V/ns
1.0V/ns
1.5V
V
DDQ
/2
See Fig. 1
- 10 -
Nov. 2003
Rev 2.0
SAMSUNG [ SAMSUNG SEMICONDUCTOR ]
