LC89950
Test Conditions
1. Measure the power-supply current when no input signal is supplied.
2. Measure the pin voltages on each pin when no input signal is supplied.
3. Let V
be the OUT pin signal amplitude when a 200-kHz 350-mVp-p sine wave is input.
OUT
Then, the voltage gain (G ) for each of the R-Y and B-Y I/O systems is given by:
V
V
[mVp-p]
OUT
G = 20log ——————— [dB]
V
350 [mVp-p]
The R-Y and B-Y voltage gains (∆G ) are:
V
∆G = | G (R-Y) –G (B-Y)|
V
V
V
4. Let V1 be the OUT pin output when a 100-kHz 200-mVp-p sine wave is input.
Let V2 be the OUT pin output when a 1-MHz 200-mVp-p sine wave is input.
V2 [mVp-p]
G = 20log ——————— [dB]
f
V1 [mVp-p]
5. Input a 5-stage step waveform (350 mVp-p) and measure the levels a and b in the output signals.
Perform those measurements for both positive phase and inverted signal inputs.
<Positive phase signal input>
<Inverted signal input>
6. Measure the noise spectrum of the output signal when no input is supplied and read the 4-MHz peak.
7. Pass the output signal through a 2-MHz low-pass filter and a 100-kHz high-pass filter. Then, measure that output with
a noise meter, when no input signal is supplied. Use a 2-MHz low-pass filter with an attenuation of –60 dB at 4-MHz.
8. Input a 200-kHz 350-mVp-p sine wave.
Let V1 be the OUT pin output when SW2 is set to a.
Let V2 be the OUT pin output when SW2 is set to b.
V1 [mVp-p] – V2 [mVp-p]
Z = ———————————— × 500 [Ω]
O
V2 [mVp-p]
9. Measure the delay time of the OUT pin output with respect to the input signal. When taking this measurement, exclude
the delay associated with the low-pass filter.
No. 5440-3/5
SANYO [ SANYO SEMICON DEVICE ]
