GP2W0104YP
115 kbps Transceiver
RELIABILITY
TEST ITEMS
FAILURE JUDGEMENT SAMPLES
DEFEC-
NOTE
TEST CONDITIONS
CRITERIA
(n)
TIVE (c)
1 cycle -30°C to 85°C
(30 minutes) 20 cycles test
Temperature cycling
n = 22
c = 0
c = 0
1, 3, 4
1, 3, 4
High temperature and high
humidity storage
+40°C, 90% RH, 20 hours
n = 22
High temperature storage +85°C, 240 hours
Low temperature storage -30°C, 240 hours
n = 22
n = 22
n = 11
c = 0
c = 0
c = 0
1, 3, 4
1, 3, 4
1, 3, 4
IDD > Up × 1.2
L < Low × 0.8
IE < Low × 0.8
IE > Up × 1.2
Operation life 1
+25°C, VDD = 3.3 V, 240 hours
+25°C, VDD = LEDA = 3.3 V,
240 hours, Pulse width 78.1 µs,
Duty ratio 3/16
1000 m/s2, 6 ms,
3 times/±X, ±Y, ±± direction
200 m/s2,
Operation life 2
Up: Upper
Specification Limint
n = 11
n = 11
c = 0
c = 0
1, 3, 4
3, 4
Mechanical shock
Low: Lower
Specification Limint
Variable frequency
vibration
100 to 2,000 to 100 Hz for
Approximately 4 minutes
48 minutes/X, Y, ± direction
n = 11
n = 11
c = 0
c = 0
3, 4
Reflow solder head
230°C, 5 s
2, 3, 4
NOTES:
1. The sample to be tested shall be left at normal temperature and humidity for
2 hours after it is taken out of the chamber. No dew point.
2. Refer to the ‘Precautions for Soldering’ section for temperature profile.
3. Confidence level: 90%
4. LTPD: 10%/20%.
8
IrDA Data Sheet
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
