Preliminary
...the world's most energy friendly microcontrollers
3 Electrical Characteristics
3.1 Test Conditions
3.1.1 Typical Values
The typical data are based on T
AMB
=25°C and V
DD
=3.0 V, as defined in Table 3.2 (p. 8) , by simu-
lation and/or technology characterisation unless otherwise specified.
3.1.2 Minimum and Maximum Values
The minimum and maximum values represent the worst conditions of ambient temperature, supply volt-
age and frequencies, as defined in Table 3.2 (p. 8), by simulation and/or technology characterisa-
tion unless otherwise specified.
3.2 Absolute Maximum Ratings
The absolute maximum ratings are stress ratings, and functional operation under such conditions are
not guaranteed. Stress beyond the limits specified in Table 3.1 (p. 8) may affect the device reliability
or cause permanent damage to the device. Functional operating conditions are given in Table 3.2 (p.
Table 3.1. Absolute Maximum Ratings
Symbol
T
STG
T
S
V
DDMAX
V
IOPIN
1
Parameter
Storage tempera-
ture range
Maximum soldering
temperature
External main sup-
ply voltage
Voltage on any I/O
pin
Condition
Min
-40
Typ
Max
150
1
Unit
°C
Latest IPC/JEDEC J-STD-020
Standard
0
-0.3
260 °C
3.8 V
V
DD
+0.3 V
Based on programmed devices tested for 10000 hours at 150ºC. Storage temperature affects retention of preprogrammed cal-
ibration values stored in flash. Please refer to the Flash section in the Electrical Characteristics for information on flash data re-
tention for different temperatures.
3.3 General Operating Conditions
3.3.1 General Operating Conditions
Table 3.2. General Operating Conditions
Symbol
T
AMB
V
DDOP
f
APB
f
AHB
Parameter
Ambient temperature range
Operating supply voltage
Internal APB clock frequency
Internal AHB clock frequency
Min
-40
1.85
Typ
Max
Unit
85 °C
3.8 V
24 MHz
24 MHz
2013-10-09 - EFM32ZG210FXX - d0065_Rev0.60
8
www.silabs.com
SILICONIMAGE [ Silicon image ]
