CXL1517M/1518M
Electrical Characteristics Test Circuit
a
SW1
a
b
a
a
V3
V1
XDL XDL
2
1
V4
1µ
16V
V
DD
3.3k
c
No signal (GND)
b
100kHz, 100mVp-p sine wave
1MHz, 100mVp-p sine wave
b
b
SW6 SW5 SW4
1µ
1µ
16V 16V
20
19
18
17
16
15
14
13
12
11
a
b
V
DD
c
3.3k
SW3
×1
L.P.F
1
2
3
4
5
6
7
8
9
10
1µ
16V
1µ
16V
V5
×1
V
DD
3.3k
V6
10k 10k 10k
E1
V2
A1
V
DD
a
SW2
b
Application Circuit
XDL XDL
V
DD
1
2
47µ
16V
Input A
0.1µ
16V
V
DD
1µ
16V
3.3k
Output A
1µ 1µ
16V 16V
20
19
100p
17
16
15
14
13
12
11
18
V
DD
1
2
3
1µ
16V
0.1µ
16V
Input
B
4
5
6
7
8
9
10
1µ
16V
V
DD
3.3k
Output C
3.3k
Output B
100p
100p
0.1µ
4.7µ 16V
4.7µ
16V
16V
V
DD
Input CLP V
DD
C input
Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for
any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same.
–6–
SONY [ SONY CORPORATION ]
