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L2520104R7M 参数 Datasheet PDF下载

L2520104R7M图片预览
型号: L2520104R7M
PDF下载: 下载PDF文件 查看货源
内容描述: 铁素贴片电感 [FERRITE CHIP INDUCTORS]
分类和应用:
文件页数/大小: 7 页 / 345 K
品牌: SUPERWORLD [ SUPERWORLD ELECTRONICS ]
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FERRITE CHIP INDUCTORS
7. RELIABILITY & TEST CONDITION :
L201610 SERIES
TEST CONDITION
Size
L201610
mm (inches)
1.40(0.055)
P-Kgf
1.0
ITEM
Bending Strength
PERFORMANCE
The ferrite should not be damaged by forces
applied on the right condition.
R0.5(0.02)
1.0(0.039)
Chip
A
Random Vibration Test
Appearance : Cracking, Chipping & any other
defects harmful to the characteristics should
not be allowed.
Inductance: within±30%
No mechanical damage
Inductance change : within±10%
Frequency : 10-55-10Hz for 15 min.
Amplitude : 1.52mm
Directions & times : X, Y, Z directions for 15 mins
This cycle shall be performed 12 times in each of three
mutually perpendicular direction.(Total 9 hours)
Drop 10 times on a concrete floor from a
height of 75cm.
Temperature : 105±2°C
Applied Current : rated current
Duration : 1008±12hrs
Measured at room temperature after placing for 2 to 3hrs.
Humidity : 90~95% RH.
Temperature : 40±2°C
Duration : 504±8hrs
Measured at room temperature after placing for 2 to 3hrs.
Drop
Life testing at high temperature Appearance : No damage.
Inductance : Within ±10% of initial value.
Temperature
Humidity
Thermal Shock
Appearance : No damage.
Inductance : Within ±10% of initial value.
Phase
1
2
3
Temperature (°C)
-40±2°C
room temp
+105±2°C
Times (min.)
30±5
<0.5
30±5
Condition for 1 cycle
Step1 : -40±2°C 30±5 min.
Step2 : +105±5°C 30±5 min.
Number of cycles : 500
Measured at room temperature after placing for 2 to 3hrs.
Measured : 500 times
Low temperature storage test
Appearance : No damage.
Inductance : Within ±30% of initial value.
Temperature : -40±2°C
Duration : 500±8hrs
Measured at room temperature after placing for 2 to 3hrs.
NOTE : Specifications subject to change without notice. Please check our website for latest information.
13.10.2011
SUPERWORLD ELECTRONICS (S) PTE LTD
PG. 4