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CD74HCT670MTG4 参数 Datasheet PDF下载

CD74HCT670MTG4图片预览
型号: CD74HCT670MTG4
PDF下载: 下载PDF文件 查看货源
内容描述: 高速CMOS逻辑4×4寄存器文件 [High-Speed CMOS Logic 4x4 Register File]
分类和应用: 内存集成电路静态存储器光电二极管
文件页数/大小: 17 页 / 568 K
品牌: TAOS [ TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS ]
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CD54HC670, CD74HC670, CD74HCT670
Test Circuits and Waveforms
6ns
OUTPUT
DISABLE
90%
50%
10%
t
PZL
50%
10%
t
PHZ
OUTPUT HIGH
TO OFF
OUTPUTS
ENABLED
90%
50%
OUTPUTS
DISABLED
OUTPUTS
ENABLED
t
PZH
OUTPUT HIGH
TO OFF
OUTPUTS
ENABLED
OUTPUT LOW
TO OFF
t
PHZ
90%
(Continued)
t
r
V
CC
GND
t
PLZ
OUTPUT
DISABLE
6ns
t
f
2.7
1.3
6ns
3V
0.3
t
PZL
GND
6ns
t
PLZ
OUTPUT LOW
TO OFF
10%
t
PZH
1.3V
1.3V
OUTPUTS
DISABLED
OUTPUTS
ENABLED
FIGURE 7. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
IC WITH
THREE-
STATE
OUTPUT
OUTPUT
R
L
= 1kΩ
C
L
50pF
V
CC
FOR t
PLZ
AND t
PZL
GND FOR t
PHZ
AND t
PZH
NOTE: Open drain waveforms t
PLZ
and t
PZL
are the same as those for three-state shown on the left. The test circuit is Output R
L
= 1kΩ to
V
CC
, C
L
= 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
8