TSC80C31/80C51
Idle ICC is measured with all output pins disconnected ;
XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL =
VSS + 0.5 V, VIH = VCC – 0.5 V ; XTAL2 N.C ; Port 0 =
VCC ; EA = RST = VSS.
Figure 7. ICC Test Condition, Idle Mode.
Power Down ICC is measured with all output pins
disconnected ; EA = PORT 0 = VCC ; XTAL2 N.C. ;
RST = VSS.
Note 2 : Capacitance loading on Ports 0 and 2 may cause
spurious noise pulses to be superimposed on the VOLS of
ALE and Ports 1 and 3. The noise is due to external bus
capacitance discharging into the Port 0 and Port 2 pins
when these pins make 1 to 0 transitions during bus
operations. In the worst cases (capacitive loading 100
pF), the noise pulse on the ALE line may exceed 0.45 V
with maxi VOL peak 0.6 V. A Schmitt Trigger use is not
necessary.
All other pins are disconnected.
Figure 8. ICC Test Condition, Active Mode.
Note 3 : Typicals are based on a limited number of
samples and are not guaranteed. the values listed are at
room temperature and 5V.
Note 4 : Under steady state (non–transient)) conditions,
IOL must be externally limited as follows :
Maximum IOL per port pin :
Maximum IOL per 8–bit port :
Port 0 :
Ports 1, 2 and 3 :
Maximum total IOL for all output pins :
10 mA
All other pins are disconnected.
26 mA
15 mA
71 mA
Figure 9. ICC Test Condition, Power Down Mode.
If IOL exceed the test condition, VOL may exceed the
related specification. Pins are not guaranteed to sink
current greater than the listed test conditions.
All other pins are disconnected.
Figure 10. Clock Signal Waveform for ICC Tests in Active and Idle Modes.
TCLCH = TCHCL = 5 ns.
MATRA MHS
13
Rev. E (14 Jan.97)
TEMIC [ TEMIC SEMICONDUCTORS ]
