W83176R-732
8. SPECIFICATIONS
8.1 Absolute Maximum Ratings
Stresses greater than those listed in this table may cause permanent damage to the device.
Precautions should be taken to avoid application of any voltage higher than the maximum rated
voltages to this circuit. Maximum conditions for extended periods may affect reliability. Unused inputs
must always be tied to an appropriate logic voltage level (Ground or VDD).
SYMBOL
PARAMETER
RATING
VDD, AVDD
T
STG
T
B
T
A
Voltage on any pin with respect to GND
Storage Temperature
Ambient Temperature
Operating Temperature
-0.5V to +3.6V
-65°C to +150°C
-55°C to +125°C
0°C to +70°C
8.2 A.C. Characteristics
VDD = AVDD = 2.5V
±5
%, T
A
= 0°C to +70°C, Test load = 10 pF
PARAMETER
SYM.
MIN.
TYP.
MAX.
UNITS
TEST CONDITIONS
Operating Clock
Frequency
Input Clock Duty Cycle
Dynamic Supply Current
Cycle to Cycle Jitter
Output to Output Skew
Output Clock Rise Time
Output Clock Fall Time
Output Clock Duty Cycle
Output Differential-pair
Crossing Voltage
F
IN
Dtin
Idd
C-
Cjitter
Tskew
Tor
Tof
Dtot
Voc
100
40
200
60
300
200
100
MHz
%
mA
pS
pS
pS
pS
%
V
Fin = 100 to 200 MHz
Fout = 100 to 200 MHz
Fout = 100 to 200 MHz
Fout = 100 to 200 MHz
Fout = 100 to 200 MHz
Fout = 100 to 200 MHz
Fout = 100 to 200 MHz
650
650
45
(VDD/2)
-0.2
VDD/
2
950
950
55
(VDD/2)
+ 0.2
8.3 D.C. Characteristics
VDD = AVDD= 2.5V
±5
%, T
A
= 0°C to +70°C
PARAMETER
SYM.
MIN.
TYP.
MAX.
UNITS
TEST CONDITIONS
SDATA, SCLK Input Low
Voltage
SDATA, SCLK Input High
Voltage
SV
IL
SV
IH
2.2
1.0
V
dc
V
dc
-6-
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