WM2629 参数 Datasheet PDF下载

Production Data

WM2629

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

Digital supply voltages, AVDD or DVDD to GND

Reference voltage

Digital input voltage range to GND

Operating temperature range, T

A

Storage temperature

Soldering temperature, 1.6mm (1/16 inch) from package body for 10

seconds

WM2629CDT

WM2629IDT

-0.3V

-0.3V

0°C

-40°C

-65°C

MIN

MAX

7V

AVDD + 0.3V

DVDD + 0.3V

70°C

85°C

150°C

260°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

Supply voltage

High-level digital input voltage

Low-level digital input voltage

Reference voltage to REF

Output Load Resistance

Load capacitance

Operating free-air temperature

SYMBOL

AVDD,

DVDD

V

IH

V

IL

V

REF

R

L

C

L

T

A

AVDD = 5V

AVDD = 3V

TEST CONDITIONS

MIN

2.7

2

GND

GND

2

WM2629CDT

WM2629IDT

0

-40

100

70

85

4.096

2.048

0.8

AVDD

AVDD

TYP

MAX

5.5

UNIT

V

V

V

V

kΩ

pF

°C

°C

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 April 2001

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