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SLAS533 – MARCH 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
DESCRIPTION (CONTINUED)
The PCM3060 can be software-controlled through a 3-wire SPI-compatible or 2-wire I
2
C-compatible serial
interface, which provides access to all functions including digital attenuation, soft mute, de-emphasis etc.
The PCM3060 can be also used in hardware mode, which provides three basic functions.
The PCM3060 is fabricated using a highly advanced CMOS process and is available in a small 28-pin TSSOP
package.
The PCM3060 is suitable for various sound processing applications for DVD-RW, digital TV, STB, and other AV
equipment.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
V
CC
V
DD
AGND1, AGND2, DGND, SGND
RST, MS, MC, MD, SCKI1, SCKI2, DIN
Digital input voltage
Analog input voltage
T
A
T
stg
T
J
BCK1, BCK2, LRCK1, LRCK2, DOUT
ZEROL, ZEROR, MODE
V
IN
L, V
IN
R, V
COM
, V
OUT
L+, V
OUT
L–, V
OUT
R+, V
OUT
R–
Input current (any pins except supplies)
Ambient temperature under bias
Storage temperature
Junction temperature
Lead temperature (soldering)
Package temperature (IR reflow, peak)
(1)
(1)
VALUE
Supply voltage
Ground voltage differences
–0.3 to 6.5
–0.3 to 4
±0.1
–0.3 to 6.5
–0.3 to (V
DD
+ 0.3 V) < 4
–0.3 to (V
DD
+ 0.3 V) < 4
–0.3 to (V
CC
+ 0.3 V) < 6.5
±10
–40 to 125
–55 to 150
150
260, 5 s
260
UNIT
V
V
V
V
V
V
mA
°C
°C
°C
°C
°C
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
V
CC
V
DD
Analog supply voltage
Digital supply voltage
Digital input interface level
Digital input clock frequency
Analog input level
Analog output load resistance
Analog output load capacitance
Digital output load capacitance
Operating free-air temperature
–25
25
AC-coupled
DC-coupled
5
10
50
20
85
Sampling frequency, LRCK1, LRCK2
System clock frequency, SCKI1, SCKI2
4.5
2.7
16
2.048
3
NOM
5
3.3
MAX
5.5
3.6
96/192
36.864
UNIT
V
V
kHz
MHz
Vpp
kΩ
kΩ
pF
pF
°C
TTL compatible
2
BURR-BROWN [ BURR-BROWN CORPORATION ]
