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CY7C1356C-166AXC 参数 Datasheet PDF下载

CY7C1356C-166AXC图片预览
型号: CY7C1356C-166AXC
PDF下载: 下载PDF文件 查看货源
内容描述: 9兆位( 256千×五百十二分之三十六K&times 18 )流水线SRAM与NOBL ™架构 [9-Mbit (256 K × 36/512 K × 18) Pipelined SRAM with NoBL? Architecture]
分类和应用: 静态存储器
文件页数/大小: 32 页 / 1078 K
品牌: CYPRESS [ CYPRESS SEMICONDUCTOR ]
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CY7C1354C, CY7C1356C
Pin Definitions
Pin Name
A0, A1, A
BW
a
,BW
b
,
BW
c
,BW
d
,
WE
ADV/LD
I/O Type
Input-
synchronous
Input-
synchronous
Input-
synchronous
Input-
synchronous
Pin Description
Address inputs used to select one of the address locations.
Sampled at the rising edge of
the CLK.
Byte write select inputs, active LOW.
Qualified with WE to conduct writes to the SRAM.
Sampled on the rising edge of CLK. BW
a
controls DQ
a
and DQP
a
, BW
b
controls DQ
b
and DQP
b
,
BW
c
controls DQ
c
and DQP
c
, BW
d
controls DQ
d
and DQP
d
.
Write enable input, active LOW.
Sampled on the rising edge of CLK if CEN is active LOW. This
signal must be asserted LOW to initiate a write sequence.
Advance/load input used to advance the on-chip address counter or load a new address.
When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a
new address can be loaded into the device for an access. After being deselected, ADV/LD should
be driven LOW to load a new address.
Clock input.
Used to capture all synchronous inputs to the device. CLK is qualified with CEN.
CLK is only recognized if CEN is active LOW.
Chip enable 1 input, active LOW.
Sampled on the rising edge of CLK. Used in conjunction with
CE
2
and CE
3
to select/deselect the device.
Chip enable 2 input, active HIGH.
Sampled on the rising edge of CLK. Used in conjunction
with CE
1
and CE
3
to select/deselect the device.
Chip enable 3 input, active LOW.
Sampled on the rising edge of CLK. Used in conjunction with
CE
1
and CE
2
to select/deselect the device.
CLK
CE
1
CE
2
CE
3
OE
Input-
clock
Input-
synchronous
Input-
synchronous
Input-
synchronous
Input-
Output enable, active LOW.
Combined with the synchronous logic block inside the device to
asynchronous control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs.
When deasserted HIGH, I/O pins are tristated, and act as input data pins. OE is masked during
the data portion of a Write sequence, during the first clock when emerging from a deselected
state and when the device has been deselected.
Input-
synchronous
I/O-
synchronous
Clock enable input, active LOW.
When asserted LOW the clock signal is recognized by the
SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not
deselect the device, CEN can be used to extend the previous cycle when required.
Bidirectional data I/O lines.
As inputs, they feed into an on-chip data register that is triggered
by the rising edge of CLK. As outputs, they deliver the data contained in the memory location
specified by addresses during the previous clock rise of the read cycle. The direction of the pins
is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave
as outputs. When HIGH, DQ
a
–DQ
d
are placed in a tristate condition. The outputs are
automatically tristated during the data portion of a write sequence, during the first clock when
emerging from a deselected state, and when the device is deselected, regardless of the state
of OE.
Bidirectional data parity I/O lines.
Functionally, these signals are identical to DQ
[a:d].
During
write sequences, DQP
a
is controlled by BW
a
, DQP
b
is controlled by BW
b
, DQP
c
is controlled by
BW
c
, and DQP
d
is controlled by BW
d
.
CEN
DQ
S
DQP
X
I/O-
synchronous
MODE
Input strap pin
Mode input.
Selects the burst order of the device. Tied HIGH selects the interleaved burst order.
Pulled LOW selects the linear burst order. MODE should not change states during operation.
When left floating MODE will default HIGH, to an interleaved burst order.
JTAG serial
output
synchronous
Serial data out to the JTAG circuit.
Delivers data on the negative edge of TCK.
TDO
TDI
TMS
TCK
V
DD
JTAG serial input
Serial data in to the JTAG circuit.
Sampled on the rising edge of TCK.
synchronous
Test mode select
This pin controls the test access port state machine.
Sampled on the rising edge of TCK.
synchronous
JTAG-clock
Power supply
Clock input to the JTAG circuitry.
Power supply inputs to the core of the device.
Document Number: 38-05538 Rev. *K
Page 7 of 32