±15kV ESD-Protected, Quad,
Low-Voltage, SPST Analog Switches
ELECTRICAL CHARACTERISTICS—Single +3V Supply
(V+ = +2.7V to +3.6V, V- = 0, T
A
= T
MIN
to T
MAX
, unless otherwise noted. Typical values are at T
A
= +25°C.)
PARAMETER
ANALOG SWITCH
Analog Signal Range
(Note 3)
COM_ to NO_, COM_ to NC_
On-Resistance
LOGIC INPUT
IN_ Input Logic Threshold High
IN_ Input Logic Threshold Low
IN_ Input Current Logic High
or Low
V
IN_H
V
IN_L
I
INH_
, I
INL_
V
IN_
= 0.8V or 2.4V
C, E
C, E
C, E
-1
2.0
1.1
1.1
0.03
0.5
1
V
V
µA
V
COM_
, V
NO_
,
V
NC_
R
ON
V+ = 2.7V, V
COM_
= 1.0V,
I
COM_
= 0.1mA
C, E
+25°C
C, E
0
200
V+
400
500
V
Ω
SYMBOL
CONDITIONS
T
A
MIN
TYP
(Note 2)
MAX
UNITS
MAX4551/MAX4552/MAX4553
SWITCH DYNAMIC CHARACTERISTICS
(Note 4)
Turn-On Time
Turn-Off Time
Break-Before-Make Time Delay
(MAX4553 Only)
Charge Injection
POWER SUPPLY
V+ Supply Current
ESD PROTECTION
On NC_ and NO_ Pins
per IEC 801-2
All Pins
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
Contact Discharge IEC 1000-4-2
Air Discharge IEC 1000-4-2
Human Body Model
MIL-STD-883C Method 3015
+25°C
+25°C
+25°C
+25°C
±8
±15
±15
±2.5
kV
kV
I+
V+ = 3.6V, all V
IN_
= 0 or V+
+25°C
C, E
-1
-1
0.05
1
1
µA
t
ON
t
OFF
t
BBM
Q
V
COM_
= 1.5V, V+ = 2.7V,
Figure 1
V
COM_
= 1.5V, V+ = 2.7V,
Figure 1
V
COM_
= 1.5V, V+ = 3.6V,
Figure 2
C
L
= 1nF, V
NO_
= 0, R
S
= 0,
Figure 3
+25°C
C, E
+25°C
C, E
+25°C
+25°C
10
50
1
5
160
190
350
400
250
300
ns
ns
ns
pC
The algebraic convention is used in this data sheet; the most negative value is shown in the minimum column.
Guaranteed by design.
∆R
ON
=
∆R
ON(MAX)
-
∆R
ON(MIN)
.
Resistance flatness is defined as the difference between the maximum and minimum on-resistance values, as measured
over the specified analog signal range.
Leakage parameters are 100% tested at maximum rated temperature, and guaranteed by correlation at T
A
= +25°C.
Off-isolation = 20log10 [ V
COM_
/ (V
NC_
or V
NO_
) ], V
COM_
= output, V
NC_
or V
NO_
= input to off switch.
Between any two switches.
Leakage testing for single-supply operation is guaranteed by testing with dual supplies.
_______________________________________________________________________________________
5