MIC281
Symbol
V
IL
Parameter
Low Input Voltage
High Input Voltage
Input Capacitance,
Note 5
Input current
CLK (clock) period
Data in Setup Time to CLK High
Data Out Stable After CLK Low
DATA Low Setup Time to CLK Low
Bus timeout
Start Condition
DATA High Hold Time After CLK High Stop Condition
2.5
100
300
100
100
25
30
35
Condition
3.0V ≤ V
DD
≤ 3.6V
3.0V ≤ V
DD
≤ 3.6V
Min
Typ
Max
0.8
2.1
10
±1
5.5
Serial Clock Input, CLK
Micrel
Units
V
V
pF
µA
µs
ns
ns
ns
ns
ms
V
IH
C
IN
I
LEAK
t
1
t
2
t
3
t
4
t
5
t
TO
Serial Interface Timing
Note 1.
The device is not guaranteed to function outside its operating range.
Note 2.
Final test on outgoing product is performed at T
A
= 25°C.
Note 3.
T
D
is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 5.
Note 4.
Current into the DATA pin will result in self-heating of the device. Sink current should be minimized for best accuracy.
Note 5.
Guaranteed by design over the operating temperature range. Not 100% production tested.
Note 6.
Accuracy specifications do not include quantization noise which may be up to ± 0.5LSB.
Note 7.
Devices are ESD sensitive. Observe appropriate handling precautions.
Timing Diagram
t
1
SCL
SDA
DATA INPUT
SDA
DATA OUTPUT
t
4
t
2
t
3
t
5
Serial Interface Timing
MIC281
4
November 2004
MICREL [ MICREL SEMICONDUCTOR ]
