TC850
FIGURE 1-1:
STANDARD TEST CIRCUIT CONFIGURATION
+5V
-5V
40
V
DD
16
8
9
10
11
12
13
14
15
1
2
3
4
5
6
7
17
61.44 kHz
**
18
**
21
OSC
2
COMP
20
DGND
22
V
SS
IN+
32 100MΩ
31
30
39
33
36
38
37
34
35
0.01µF Input
+1.6384V
+0.0256V
1µF*
BUSY
DB7
IN-
DB6
ANALOG COMMON
DB5
REF
1
+
DB4
REF
2
+
DB3
REF-
DB2
TC850
C
REF1
+
DB1
DB0
C
REF1
-
CS
C
REF2
+
CE
C
REF2
-
WR
BUFFER
RD
INT
IN
CONT/DEMAND
OVR/POL
INT
OUT
L/H
OSC
1
1µF*
25 120MkΩ
24
23
R
INT
0.1µF
C
INT
NC
TEST 19
C
INTA
C
INTB
C
BUFA
C
BUFB
28
0.1
µF
0.1
µF
29
0.1
µF
27
0.1
µF
26
0.1
µF
NOTES:
Unless otherwise specified, all 0.1µF capacitors are film dielectric.
Ceramic capacitors are not recommended.
NC = No Connection
*Polypropylene capacitors.
** 100pF Mica capacitors.
2002 Microchip Technology Inc.
DS21479B-page 5
©
MICROCHIP [ MICROCHIP TECHNOLOGY ]
