MC10105
ELECTRICAL CHARACTERISTICS
(continued)
TEST VOLTAGE VALUES
(Volts)
@ Test Temperature
–30°C
+25°C
+85°C
Pin
Under
Test
8
4
4
3
2
3
2
3
2
3
2
4
4
4
4
4
4
Pulse In
t4+3–
t4–3+
t4+2+
t4–2–
(20 to 80%)
(20 to 80%)
t3+
t2+
t3–
t2–
3
3
2
2
3
2
3
2
4
4
4
4
4
4
4
4
Pulse Out
3
3
2
2
3
2
3
2
4
4
VIHmax
–0.890
–0.810
–0.700
VILmin
–1.890
–1.850
–1.825
VIHAmin
–1.205
–1.105
–1.035
VILAmax
–1.500
–1.475
–1.440
VEE
–5.2
–5.2
–5.2
(VCC)
Gnd
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
+2.0 V
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
1, 16
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
VIHmax
VILmin
VIHAmin
VILAmax
VEE
8
8
8
8
8
8
8
8
8
8
8
–3.2 V
8
8
8
8
8
8
8
8
Characteristic
Power Supply Drain Current
Input Current
Symbol
IE
IinH
IinL
Output Voltage
Output Voltage
Threshold Voltage
Threshold Voltage
Switching Times
Propagation Delay
Logic 1
Logic 0
Logic 1
Logic 0
(50Ω Load)
VOH
VOL
VOHA
VOLA
Rise Time
Fall Time
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
MECL Data
DL122 — Rev 6
3–23
MOTOROLA
ONSEMI [ ON SEMICONDUCTOR ]
